Optimization of the LPCVD equipment intergraded production system of the solar cell production line

2019 ◽  
Author(s):  
Xiaohui Dong ◽  
Ruhong Ma
Solar Cells ◽  
1984 ◽  
Vol 11 (1) ◽  
pp. 13-18
Author(s):  
P.H. Fang ◽  
Z. Huan ◽  
J.H. Kinnier ◽  
C.C. Schubert

2021 ◽  
Vol 59 ◽  
pp. 127-137
Author(s):  
Feng-Que Pei ◽  
Yi-Fei Tong ◽  
Ming-Hai Yuan ◽  
Kun Ding ◽  
Xi-Hui Chen

1996 ◽  
Vol 442 ◽  
Author(s):  
O.V. Astafiev ◽  
V.P. Kalinushkin ◽  
N.V. Abrosimov

AbstractMapping Low Angle Light Scattering method (MLALS) is proposed to study defect structure in materials used for solar cell production. Several types of defects are observed in Czochralski Si1−xGex (0.022<x<0.047) single crystals. Recombination activity of these defects is investigated. The possibility of contactless visualisation of grain boundary recombination in polysilicon is also demonstrated.


Solar Cells ◽  
1988 ◽  
Vol 25 (1) ◽  
pp. 31-37 ◽  
Author(s):  
P.H. Lang

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