scholarly journals Apparatus for Seebeck coefficient measurement of wire, thin film, and bulk materials in the wide temperature range (80–650 K)

2019 ◽  
Vol 90 (10) ◽  
pp. 104901 ◽  
Author(s):  
Ashish Kumar ◽  
Ashutosh Patel ◽  
Saurabh Singh ◽  
Asokan Kandasami ◽  
D. Kanjilal
Keyword(s):  
Thin Film ◽  
Seebeck Coefficient ◽  
Wide Temperature Range ◽  
Bulk Materials ◽  
Temperature Range ◽  
Coefficient Measurement

Polymer hybrid thin films based on rare earth ion-functionalized MOF: photoluminescence tuning and sensing as a thermometer

2015 ◽  
Vol 44 (4) ◽  
pp. 1875-1881 ◽  
Author(s):  
Xiang Shen ◽  
Bing Yan
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Rare Earth ◽  
Wide Temperature Range ◽  
Rare Earth Ion ◽  
Temperature Range ◽  
Polymer Hybrid ◽  
Hybrid Thin Films

A series of photofunctional polymer hybrid thin films based on rare earth ion-functionalized MOFs have been synthesized and can display multi-colors (red, blue, blue-green and white). Interestingly, Tb0.999Eu0.001-2 thin film can be used as ratiometric luminescent thermometer in a wide temperature range.

Thin-film contact systems for thermocouples operating in a wide temperature range

2021 ◽  
Vol 852 ◽  
pp. 156889
Author(s):  
Maxim Shtern ◽  
Maxim Rogachev ◽  
Yury Shtern ◽  
Dmitry Gromov ◽  
Alexander Kozlov ◽  
...  
Keyword(s):  
Thin Film ◽  
Wide Temperature Range ◽  
Temperature Range

Fabrication of Thermoelectric La0.95Sr0.05CoO3 Thin Film and Seebeck Coefficient Measurement

2011 ◽  
Author(s):  
Weihe Xu ◽  
Qi Chen ◽  
Yong Shi ◽  
Hamid Hadim
Keyword(s):  
Thin Film ◽  
Seebeck Coefficient ◽  
Spin Coating ◽  
Complex Oxide ◽  
Perovskite Oxides ◽  
Voltage Output ◽  
Custom Made ◽  
Coefficient Measurement ◽  
Micro Electromechanical System ◽  
P Type

The P-type perovskite oxides La1-xSrxCoO3 are a promising group of complex oxide thermoelectric (TE) materials because of its a higher Seebeck coefficient. In this paper, the La0.95Sr0.05CoO3 thin film was prepared by spin coating. A custom-made MEMS (micro-electromechanical system) based device was used to measure the voltage output and Seebeck coefficient of the thin film. The measured Seebeck coefficient of the thin film was 350 μV/K.

On the Performance of Thin-Film Lateral SOI PIN Diodes as Thermal Sensors in a Wide Temperature Range

2019 ◽  
Vol 23 (1) ◽  
pp. 397-404 ◽  
Author(s):  
Michelly De Souza ◽  
Bertrand Rue ◽  
Denis Flandre ◽  
Marcelo A. Pavanello
Keyword(s):  
Thin Film ◽  
Wide Temperature Range ◽  
Thermal Sensors ◽  
Pin Diodes ◽  
Temperature Range

Unusually High Seebeck Coefficient Arisen from the Temperature-dependent Carrier Concentration in PbSe-AgSbSe2 Alloys

2021 ◽  
Author(s):  
Xuemei Wang ◽  
Gang Wu ◽  
Jianfeng Cai ◽  
Qiang Zhang ◽  
Junxuan Yang ◽  
...  
Keyword(s):  
Temperature Gradient ◽  
Seebeck Coefficient ◽  
Carrier Concentration ◽  
Wide Temperature Range ◽  
Induced Voltage ◽  
Temperature Dependent ◽  
Temperature Range ◽  
High Seebeck Coefficient

Seebeck coefficient describes the temperature gradient induced voltage in thermoelectrics. Usually, to obtain a high Seebeck coefficient within a wide temperature range is difficult, as it is limited by the...

Electrical properties of thin-film resistors in a wide temperature range

Circuit World ◽  
2015 ◽  
Vol 41 (3) ◽  
pp. 116-120 ◽  
Author(s):  
Paweł Winiarski ◽  
Adam Kłossowicz ◽  
Jacek Wróblewski ◽  
Andrzej Dziedzic ◽  
Wojciech Stęplewski
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Low Temperature ◽  
Wide Temperature Range ◽  
Linear Temperature Dependence ◽  
Content Type ◽  
Temperature Range ◽  
Wide Range ◽  
Thin Film Resistors ◽  
Thermal Shocks

Purpose – The purpose of this paper is to characterize electrical properties of nickel-phosphorus (Ni-P) thin-film resistors made on FR-4 laminate in a wide range of temperature (from −180 to 20°C). Design/methodology/approach – The study was performed using resistors made of Ni-P foil with two different thicknesses (0.1 or 0.05 μm) and sheet resistances (100 or 250 Ω/sq), respectively. The resistance rectangular resistors had length and width from the range between 0.59 and 5.91 mm. The resistance versus temperature characteristics and their distribution as well as resistors ' durability to low-temperature thermal shocks were investigated. Findings – The results showed almost linear temperature dependence of resistance with a negative temperature coefficient of resistance of about −95 ppm/°C for 250 Ω/sq layer and −55 ppm/°C for 100 Ω/sq layer. A very small dimensional effect was observed for sheet resistance as well as for R(T) characteristic. Thin-film resistors are also characterized by very high durability to low-temperature thermal shocks. Originality/value – The results presented in this paper can be very useful for low-temperature applications of thin-film resistors made on printed circuit boards. They suggest possibility of wide applications of these components in a wide temperature range.

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