Simultaneous single-peak and narrowband thermal emission enabled by hybrid metal-polar dielectric structures

2019 ◽  
Vol 115 (9) ◽  
pp. 093505 ◽  
Author(s):  
Lu Cai ◽  
Qiang Li ◽  
Jianbo Yu ◽  
Hao Luo ◽  
Kaikai Du ◽  
...  
Keyword(s):  
Thermal Emission ◽  
Single Peak ◽  
Polar Dielectric ◽  
Dielectric Structures

Measurement of lattice parameter at the nanometer scale using convergent-beam microdiffraction from a thermal emission source

1993 ◽  
Vol 51 ◽  
pp. 690-691
Author(s):  
W. T. Pike
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Thermal Emission ◽  
Lattice Parameter ◽  
Scanning Transmission Electron Microscope ◽  
Emission Source ◽  
Device Structure ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Convergent Beam

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.

Single-peak-regulation and wide-angle dual-band metamaterial absorber based on hollow-cross and solid-cross resonators

2020 ◽  
Vol 91 (3) ◽  
pp. 30901
Author(s):  
Yibo Tang ◽  
Longhui He ◽  
Jianming Xu ◽  
Hailang He ◽  
Yuhan Li ◽  
...  
Keyword(s):  
Transverse Electric ◽  
Surface Current ◽  
Dielectric Substrate ◽  
Transverse Magnetic ◽  
Metamaterial Absorber ◽  
Absorption Peak ◽  
Dual Band ◽  
Single Peak ◽  
Wide Angle ◽  
Surface Current Density

A dual-band microwave metamaterial absorber with single-peak regulation and wide-angle absorption has been proposed and illustrated. The designed metamaterial absorber is consisted of hollow-cross resonators, solid-cross resonators, dielectric substrate and metallic background plane. Strong absorption peak coefficients of 99.92% and 99.55% are achieved at 8.42 and 11.31 GHz, respectively, which is basically consistent with the experimental results. Surface current density and changing material properties are employed to illustrate the absorptive mechanism. More importantly, the proposed dual-band metamaterial absorber has the adjustable property of single absorption peak and could operate well at wide incidence angles for both transverse electric (TE) and transverse magnetic (TM) waves. Research results could provide and enrich instructive guidances for realizing a single-peak-regulation and wide-angle dual-band metamaterial absorber.

Application of Backside Photo and Thermal Emission Microscopy Techniques to Advanced Memory Devices

1997 ◽  
Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel
Keyword(s):  
Thermal Emission ◽  
Test Cases ◽  
Memory Devices ◽  
Front Side ◽  
Emission Analysis ◽  
Intensity Attenuation ◽  
Analysis Techniques ◽  
Defect Sites ◽  
Emission Microscopy ◽  
Microscopy Techniques

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.

APPROACHES TO MODELING THERMAL EMISSION AND REFLECTANCE IN CRISM AND OMEGA OBSERVATIONS FROM 1-5 μM

2017 ◽  
Author(s):  
Kathryn E. Powell ◽  
◽  
Raymond E. Arvidson ◽  
Linyun He ◽  
Joseph A. O'Sullivan
Keyword(s):  
Thermal Emission
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