The distribution of the electric field of discharge cells according to working gas pressures

2019 ◽  
Author(s):  
Don-Kyu Lee
Keyword(s):  
Electric Field ◽  
Discharge Cells ◽  
Gas Pressures

Analysis of Electric Field Distribution in the Cylindrical Cathode Fall Region of Ar Hollow Cathode Discharges

1988 ◽  
Vol 42 (5) ◽  
pp. 815-819 ◽  
Author(s):  
Chiaki Hirose ◽  
Yukio Adachi ◽  
Takashi Masaki
Keyword(s):  
Theoretical Model ◽  
Electric Field ◽  
Electric Fields ◽  
Hollow Cathode ◽  
Electric Field Distribution ◽  
Preceding Paper ◽  
Cathode Fall ◽  
Negative Glow ◽  
Ion Density ◽  
Gas Pressures

A theoretical model, as described in the preceding paper, has been applied to the analysis of the observed radial distribution of the electric field which was measured in the cathode fall region of Ar hollow cathode discharges under pressures from 1 to 6 Torr and discharge currents from 12 to 20 mA. The distribution of ion density was calculated from the derived parameters, confirming the monotonie increase toward the negative glow region. The derived values of the parameters are briefly discussed in relation to the conceivable physical picture of the processes taking place in the relevant region. A list of observed electric fields at various radial positions, gas pressures, and discharge currents is also given.

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Principles of Low-Vacuum SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1304-1305
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
New Technologies ◽  
High Vacuum ◽  
Optical Microscope ◽  
Specimen Surface ◽  
Electrical Field ◽  
Gaseous Environment ◽  
New Information ◽  
Gas Molecules ◽  
New Interactions ◽  
Gas Pressures

Only recently it became possible to expand scanning electron microscopy to low vacuum and atmospheric pressure through the introduction of several new technologies. In principle, only the specimen is provided with a controlled gaseous environment while the optical microscope column is kept at high vacuum. In the specimen chamber, the gas can generate new interactions with i) the probe electrons, ii) the specimen surface, and iii) the specimen-specific signal electrons. The results of these interactions yield new information about specimen surfaces not accessible to conventional high vacuum SEM. Several microscope types are available differing from each other by the maximum available gas pressure and the types of signals which can be used for investigation of specimen properties.Electrical non-conductors can be easily imaged despite charge accumulations at and beneath their surface. At high gas pressures between 10-2 and 2 torr, gas molecules are ionized in the electrical field between the specimen surface and the surrounding microscope parts through signal electrons and, to a certain extent, probe electrons. The gas provides a stable ion flux for a surface charge equalization if sufficient gas ions are provided.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Linear growth of instabilities on a liquid metal under normal electric field

1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid
Keyword(s):  
Liquid Metal ◽  
Electric Field ◽  
Linear Growth ◽  
Normal Electric Field
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