Automatic defect localization and characterization through machine learning based inversion for guided wave imaging in SHM
2021 ◽
Keyword(s):
2022 ◽
Vol 169
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pp. 108761
2020 ◽
Vol 378
(2182)
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pp. 20190581
2012 ◽
Vol 132
(3)
◽
pp. 1933-1933
2015 ◽
Vol 37
(10)
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pp. 1274-1281
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