scholarly journals Thickness measurement of polymer thin films with high frequency ultrasonic transducers

2019 ◽  
Author(s):  
Richard J. Smith ◽  
Salvatore La Cavera ◽  
Fernando Pérez-Cota ◽  
Leonel Marques ◽  
Matt Clark
Keyword(s):  
Thin Films ◽  
High Frequency ◽  
Polymer Thin Films ◽  
Thickness Measurement ◽  
Ultrasonic Transducers

Complex permittivity measurements of RF plasma polymerized polyterpenol organic thin films employing split post dielectric resonator

2011 ◽  
Vol 31 (2-3) ◽  
Author(s):  
Kateryna Bazaka ◽  
Mohan V. Jacob
Keyword(s):  
Thin Films ◽  
Low Cost ◽  
Polymer Thin Films ◽  
Wavelength Region ◽  
Thickness Measurement ◽  
Organic Polymer ◽  
Rf Plasma ◽  
Potential Applications ◽  
Permittivity Measurements ◽  
Physical And Chemical

Abstract In the fields of organic electronics and biotechnology, applications for organic polymer thin films fabricated using low-temperature non-equilibrium plasma techniques are gaining significant attention because of the physical and chemical stability of thin films and the low cost of production. Polymer thin films were fabricated from non-synthetic terpinen-4-ol using radiofrequency polymerization (13.56 MHz) on low loss dielectric substrates and their permittivity properties were ascertained to determine potential applications for these organic films. Real and imaginary parts of permittivity as a function of frequency were measured using the variable angle spectroscopic ellipsometer. The real part of permittivity (k) was found to be between 2.34 and 2.65 in the wavelength region of 400–1100 nm, indicating a potential low-k material. These permittivity values were confirmed at microwave frequencies. Dielectric properties of polyterpenol films were measured by means of split post dielectric resonators (SPDRs) operating at frequencies of 10 GHz and 20 GHz. Permittivity increased for samples deposited at higher RF energy – from 2.65 (25 W) to 2.83 (75 W) measured by a 20-GHz SPDR and from 2.32 (25 W) to 2.53 (100 W) obtained using a 10-GHz SPDR. The error in permittivity measurement was predominantly attributed to the uncertainty in film thickness measurement.

Magnetic properties of FeXNi100-X (X=20, 17, 15 %) thin films: focus on high-frequency sensory applications

2019 ◽  
pp. 20-25
Author(s):  
Anna Chlenova ◽  
◽  
Elizaveta Golubeva ◽  
Iuliia Novoselova ◽  
Ruslan Salikhov ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
High Frequency

scholarly journals Measurement of Electrical Properties of Superconducting YBCO Thin Films in the VHF Range

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3360
Author(s):  
Yakir Dahan ◽  
Eldad Holdengreber ◽  
Elichai Glassner ◽  
Oz Sorkin ◽  
Shmuel E. Schacham ◽  
...  
Keyword(s):  
Thin Films ◽  
Theoretical Model ◽  
Quality Factor ◽  
High Frequency ◽  
Unit Length ◽  
Superconducting Thin Films ◽  
Electrical Parameters ◽  
Very High Frequency ◽  
Production Constraints ◽  
Very High

A new measurement technique of electrical parameters of superconducting thin films at the Very High Frequency (VHF) range is described, based on resonators with microstrip (MS) structures. The design of an optimal resonator was achieved, based on a thorough theoretical analysis, which is required for derivation of the exact configuration of the MS. A theoretical model is presented, from which an expression for the attenuation of a MS line can be derived. Accordingly, simulations were performed, and an optimal resonator for the VHF range was designed and implemented. Production constraints of YBa2Cu3O7 (YBCO) limited the diameter of the sapphire substrate to 3″. Therefore, a meander configuration was formed to fit the long λ/4 MS line on the wafer. By measuring the complex input reflection coefficients of a λ/4 resonator, we extracted the quality factor, which is mainly affected by the dielectric and conductor attenuations. The experimental results are well fitted by the theoretical model. The dielectric attenuation was calculated using the quasi-static analysis of the MS line. An identical copper resonator was produced and measured to compare the properties of the YBCO resonator in reference to the copper one. A quality factor of ~6·105 was calculated for the YBCO resonator, three orders of magnitude larger than that of the copper resonator. The attenuation per unit length of the YBCO layer was smaller by more than five orders of magnitude than that of the copper.

scholarly journals Molecular aggregation states of crystalline fluorinated polymer thin films

2008 ◽  
Vol 64 (a1) ◽  
pp. C560-C560
Author(s):  
K. Honda ◽  
M. Morita ◽  
S. Sasaki ◽  
O. Sakata ◽  
A. Takahara
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Molecular Aggregation ◽  
Fluorinated Polymer

Close-Packed Colloidal Monolayers of Ultra-Smooth Gold Nanospheres by Controlled Trapping onto Polymer Thin Films

2018 ◽  
Vol 26 (6) ◽  
pp. 539-543 ◽  
Author(s):  
Jun-Min Kim ◽  
Dae-Woong Jung ◽  
Gaehang Lee ◽  
Gi-Ra Yi
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Gold Nanospheres
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