Microscopic origin of the high piezoelectric response of Sm-doped BiFeO3 near the morphotropic phase boundary

2019 ◽  
Vol 125 (17) ◽  
pp. 175113
Author(s):  
Zhenyu Liao ◽  
Wei Sun ◽  
Qiqi Zhang ◽  
Jing-Feng Li ◽  
Jing Zhu
Keyword(s):  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Piezoelectric Response ◽  
Microscopic Origin

Pressure-induced suppression of piezoelectric response in a Pb(Zn1∕3Nb2∕3)O3–PbTiO3 binary system single crystal near a morphotropic phase boundary

2006 ◽  
Vol 89 (19) ◽  
pp. 192903 ◽  
Author(s):  
Naohiko Yasuda ◽  
Md. M. Rahman ◽  
Hidehiro Ohwa ◽  
Mituyoshi Matsushita ◽  
Yohachi Yamashita ◽  
...  
Keyword(s):  
Binary System ◽  
Single Crystal ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Piezoelectric Response

Pressure-induced Suppression of Piezoelectric Response in a 0.5Pb(Ni1/3Nb2/3)O3-0.5Pb(Zr0.7Ti0.3)O3Ceramic Near a Morphotropic Phase Boundary

2014 ◽  
Vol 467 (1) ◽  
pp. 173-180 ◽  
Author(s):  
Nur Hidayah ◽  
Naohiko Yasuda ◽  
Hidehiro Ohwa ◽  
Yoshihito Tachi ◽  
Yohachi Yamashita ◽  
...  
Keyword(s):  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Piezoelectric Response

Piezoelectric effect in epitaxial PbZr1−xTixO3 thin films near morphotropic phase boundary region

2005 ◽  
Vol 20 (4) ◽  
pp. 787-790 ◽  
Author(s):  
Yong Kwan Kim ◽  
Sang Sub Kim ◽  
Bongki Lee ◽  
Hyunjung Shin ◽  
Sunggi Baik
Keyword(s):  
Thin Films ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Volume Fraction ◽  
Scanning Force Microscopy ◽  
Boundary Region ◽  
Structural Instability ◽  
Piezoelectric Response ◽  
Storage Devices ◽  
Pzt Films

The relationship between crystal structure and piezo-response was investigated in epitaxially grown PbZr1−xTixO3 (PZT) thin films on Pt(001)/MgO(001) with a thin PbTiO3 interlayer. Insertion of the interlayer resulted in significant relaxation ofthe strain that could be developed in the course of deposition of the PZT films, consequently leading us to single out only the effect of composition. Composition of the morphotropic phase boundary (MPB), at which tetragonal and rhombohedral phases are mixed with the same volume fraction, was found to be ∼0.55 in Ti/(Zr + Ti) ratio in our films, which is close to the value for bulk polycrystalline PZT (∼0.50). The piezoelectric response peaks were two times higher in the MPB regime than in the single phase regime due to structural instability caused by the coexistence of two phases. The results indicate that epitaxial PZT films having the MPB composition are advantageous over those of other compositions for nano-storage devices based on scanning force microscopy.

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