An explicit electron-vibron model for olfactory inelastic electron transfer spectroscopy

In this introductory paper, my primary concern will be in identifying and outlining the various types of inelastic processes resulting from the interaction of electrons with matter. Elastic processes are understood reasonably well at the present experimental level and can be regarded as giving information on spatial arrangements. We need not consider them here. Inelastic processes do contain information of considerable value which reflect the electronic and chemical structure of the sample. In combination with the spatial resolution of the electron microscope, a unique probe of materials is finally emerging (Hillier 1943, Watanabe 1955, Castaing and Henri 1962, Crewe 1966, Wittry, Ferrier and Cosslett 1969, Isaacson and Johnson 1975, Egerton, Rossouw and Whelan 1976, Kokubo and Iwatsuki 1976, Colliex, Cosslett, Leapman and Trebbia 1977). We first review some scattering terminology by way of background and to identify some of the more interesting and significant features of energy loss electrons and then go on to discuss examples of studies of the type of phenomena encountered. Finally we will comment on some of the experimental factors encountered.

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A light optical diffractometer for electron microscopical images operating in line

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100107575 ◽

1978 ◽

Vol 36 (1) ◽

pp. 86-87

Author(s):

P. Bonhomme ◽

A. Beorchia

Keyword(s):

Electron Microscopy ◽

Electron Transfer ◽

Electron Microscope ◽

Image Converter ◽

Coherent Light ◽

Spatial Filters ◽

Electron Image ◽

Electron Microscopical ◽

Working Parameters ◽

Amorphous Part

We have already described (1.2.3) a device using a pockel's effect light valve as a microscopical electron image converter. This converter can be read out with incoherent or coherent light. In the last case we can set in line with the converter an optical diffractometer. Now, electron microscopy developments have pointed out different advantages of diffractometry. Indeed diffractogram of an image of a thin amorphous part of a specimen gives information about electron transfer function and a single look at a diffractogram informs on focus, drift, residual astigmatism, and after standardizing, on periods resolved (4.5.6). These informations are obvious from diffractogram but are usualy obtained from a micrograph, so that a correction of electron microscope parameters cannot be realized before recording the micrograph. Diffractometer allows also processing of images by setting spatial filters in diffractogram plane (7) or by reconstruction of Fraunhofer image (8). Using Electrotitus read out with coherent light and fitted to a diffractometer; all these possibilities may be realized in pseudoreal time, so that working parameters may be optimally adjusted before recording a micrograph or before processing an image.

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Inelastic Electron Scattering from Valence Electrons in Aluminum

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010009227x ◽

1976 ◽

Vol 34 ◽

pp. 462-463

Author(s):

P. E. Batson ◽

C. H. Chen ◽

J. Silcox

Keyword(s):

Electron Scattering ◽

Single Scattering ◽

Three Dimensions ◽

Inelastic Electron ◽

Weak Beam ◽

Scattering Spectrum ◽

Valence Electrons ◽

Diffraction Patterns ◽

Electronic Scattering

We wish to report in this paper measurements of the inelastic scattering component due to the collective excitations (plasmons) and single particlehole excitations of the valence electrons in Al. Such scattering contributes to the diffuse electronic scattering seen in electron diffraction patterns and has recently been considered of significance in weak-beam images (see Gai and Howie) . A major problem in the determination of such scattering is the proper correction for multiple scattering. We outline here a procedure which we believe suitably deals with such problems and report the observed single scattering spectrum.In principle, one can use the procedure of Misell and Jones—suitably generalized to three dimensions (qx, qy and #x2206;E)--to derive single scattering profiles. However, such a computation becomes prohibitively large if applied in a brute force fashion since the quasi-elastic scattering (and associated multiple electronic scattering) extends to much larger angles than the multiple electronic scattering on its own.

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Towards quantitative simulations of inelastic electron diffraction patterns and images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130481 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1170-1171

Author(s):

Z. L. Wang

Keyword(s):

Phonon Scattering ◽

Incident Beam ◽

Dynamical Theory ◽

Inelastic Electron ◽

Additional Advantage ◽

Coupled Equations ◽

Atomic Vibrations ◽

Diffraction Patterns ◽

Primary Advantage ◽

The One

A new dynamical theory has been developed based on Yoshioka's coupled equations for describing inelastic electron scattering in thin crystals. Compared to existing theories, the primary advantage of this theory is that the incoherent summation of the diffracted intensities contributed by electrons after exciting vast numbers of different excited states has been evaluated before any numerical calculation. An additional advantage is that the phase correlations of atomic vibrations are considered, so that full lattice dynamics can be combined in the phonon scattering calculation. The new theory has been proven to be equivalent to the inelastic multislice theory, and has been applied to calculate energy-filtered diffraction patterns and images formed by phonon, single electron and valence scattered electrons.A calculated diffraction pattern of elastic and phonon scattered electrons for a parallel incident beam case is in agreement with the one observed (Fig. 1), showing thermal diffuse scattering (TDS) streaks and Kikuchi pattern.

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STEM measurement of subcellular water distributions

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100148678 ◽

1993 ◽

Vol 51 ◽

pp. 568-569

Author(s):

R.D. Leapman ◽

S.Q. Sun ◽

S-L. Shi ◽

R.A. Buchanan ◽

S.B. Andrews

Keyword(s):

Water Content ◽

Internal Standard ◽

Dry Weight ◽

Dry Mass ◽

Scanning Transmission Electron Microscope ◽

Dark Field ◽

Bulk Water ◽

Inelastic Electron ◽

Scanning Transmission ◽

Annular Dark Field

Recent advances in rapid-freezing and cryosectioning techniques coupled with use of the quantitative signals available in the scanning transmission electron microscope (STEM) can provide us with new methods for determining the water distributions of subcellular compartments. The water content is an important physiological quantity that reflects how fluid and electrolytes are regulated in the cell; it is also required to convert dry weight concentrations of ions obtained from x-ray microanalysis into the more relevant molar ionic concentrations. Here we compare the information about water concentrations from both elastic (annular dark-field) and inelastic (electron energy loss) scattering measurements.In order to utilize the elastic signal it is first necessary to increase contrast by removing the water from the cryosection. After dehydration the tissue can be digitally imaged under low-dose conditions, in the same way that STEM mass mapping of macromolecules is performed. The resulting pixel intensities are then converted into dry mass fractions by using an internal standard, e.g., the mean intensity of the whole image may be taken as representative of the bulk water content of the tissue.

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Extended Core Edge Fine Structure in the E.M.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000489 ◽

1980 ◽

Vol 38 ◽

pp. 120-121

Author(s):

R.D. Leapman

Keyword(s):

Fine Structure ◽

Electron Scattering ◽

Inelastic Electron ◽

High Resolution Imaging ◽

X Ray ◽

Analytical Electron ◽

Analytical Electron Microscope ◽

Core Electrons ◽

Resolution Imaging ◽

X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

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