Auxiliary optics for meV-resolved inelastic x-ray scattering at SPring-8: Microfocus, analyzer masks, Soller slit, soller screen, and beam position monitor
Keyword(s):
X Ray
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2002 ◽
Vol 12
(6)
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pp. 385-390
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1987 ◽
Vol 48
(C9)
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pp. C9-855-C9-858
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2007 ◽
Vol 2007
(suppl_26)
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pp. 247-252