scholarly journals High brightness H- ion source for accelerators developed at TRIUMF

2018 ◽  
Author(s):  
K. Jayamanna ◽  
F. Ames ◽  
Y. Bylenskii ◽  
G. Cojocaru ◽  
B. Minato ◽  
...  
Keyword(s):  
Ion Source ◽  
High Brightness

Low‐divergence, high‐brightness lithium ion source for plasma diagnostics

1988 ◽  
Vol 59 (8) ◽  
pp. 1735-1737 ◽  
Author(s):  
D. M. Thomas ◽  
W. P. West ◽  
K. McCormick
Keyword(s):  
Plasma Diagnostics ◽  
Lithium Ion ◽  
Ion Source ◽  
High Brightness

Low‐energy (5

1995 ◽  
Vol 13 (6) ◽  
pp. 2836-2842 ◽  
Author(s):  
Y.‐W. Kim ◽  
I. Petrov ◽  
H. Ito ◽  
J. E. Greene
Keyword(s):  
Ion Beam ◽  
Ultrahigh Vacuum ◽  
Ion Source ◽  
Low Energy ◽  
High Brightness ◽  
Ion Beam Deposition ◽  
Beam Deposition

scholarly journals Characterization of a high-brightness, laser-cooled Li+ ion source

2019 ◽  
Vol 125 (7) ◽  
pp. 074904 ◽  
Author(s):  
J. R. Gardner ◽  
W. R. McGehee ◽  
J. J. McClelland
Keyword(s):  
Ion Source ◽  
High Brightness ◽  
Li Ion

Living up to the Hype(-rion)! – observations on ion microprobe geochronology using a high-brightness oxygen plasma source

2020 ◽  
Author(s):  
Martin Whitehouse ◽  
Heejin Jeon
Keyword(s):  
Aspect Ratio ◽  
Spatial Resolution ◽  
Duty Cycle ◽  
Ion Source ◽  
Primary Beam ◽  
Rf Plasma ◽  
High Brightness ◽  
Beam Density ◽  
Lower Beam ◽  
Counting Statistics

<p>The recent introduction of a high-brightness RF plasma oxygen ion source (Hyperion H201, Oregon Physics) to large geometry secondary ion mass spectrometers (e.g. CAMECA IMS1280/1300) has increased the range of available primary beam options compared to the several decades old technology of the duoplasmatron it replaces. Notably, the new source provides considerably higher beam density (ca. 10x and 3x for O<sup>-</sup> and O<sub>2</sub><sup>-</sup> respectively), which in principle allows for higher spatial resolution and/or shorter analysis times, coupled with unprecedented long-term beam stability.</p><p>Incorporating the RF plasma into both conventional spot analysis and ion-imaging geochronology routines at the NordSIMS facility has, however, revealed that the source upgrade has consequences for data-acquisition and data reduction strategies, which need to be modified in order to avoid degradation in precision. The most significant difference using the new source for spot analyses is the significant change in aspect ratio (width/depth) of the analysed volume. During a comparable length analysis, a three times brighter O<sub>2</sub><sup>-</sup> primary beam (still favoured for U-Th-Pb geochronology) will sputter a three times deeper crater that is half the width of a comparable intensity duoplasmatron beam, an effective aspect ratio change of six times, introducing “down-hole” inter-element and, to a lesser degree, isotope fractionation effects that SIMS has largely been free of. Depending on the target matrix, this can have a marked effect on the within-run ratio evolution during an analysis, particularly the inter-element ratios Pb/U and UO<sub>n</sub>/U required for full U-Pb geochronology, with standard error of the mean values several times higher than counting statistics, compared to analyses with the lower beam density of the duoplasmatron where s.e. mean commonly closely approaches Poisson counting statistics during a ca. 10 minute analysis. In line with previous observations [1], some improvements can be made by using a Pb/UO vs. UO<sub>2</sub>/UO calibration scheme instead of Pb/U vs. UO<sub>n</sub>/U, but clearly this is not the complete answer. Shortening analyses via fewer cycles in a peak-hopping routine also means smaller √n, affecting s.e. mean; lower integration times can be introduced to permit more cycles, but magnet settling times between peak jumps cannot be reduced in proportion, so the duty cycle is less efficient.</p><p>Strategies developed to mitigate this degradation and take full advantage of the new RF source include: 1) rastering of critically focused primary beams to retain high aspect ratio (at the expense of improved spatial resolution); 2) use of a defocused aperture-projected (Köhler-mode) primary beam (effectively lower beam density); 3) modelling of within-run ratio evolution based on standard analyses in a manner similar to that employed by laser ablation methods [2]; and/or 4) introduction of multicollection capabilities [3] to increase duty cycle efficiency in a shorter analysis. Ultimately, the choice of which method(s) to use will depend upon the goal of a specific project.</p><p>References: [1] Jeon, H. & Whitehouse, M.J.., Geostds & Geoanal. Res. 2014, 39, 443-452]; [2] Paton, C. et al., Geochem. Geophys. Geosyst., 2010, 11, Q0AA06]; [3] Li et al., J. Anal. At. Spectrom., 2015, 30, 979-985</p>

New Ion Source for High Precision FIB Nanomachining and Circuit Edit

2014 ◽  
Author(s):  
Adam V. Steele ◽  
Brenton Knuffman ◽  
Jabez J. McClelland
Keyword(s):  
Low Temperature ◽  
Failure Analysis ◽  
High Precision ◽  
Spot Size ◽  
Ion Source ◽  
Low Energy ◽  
Energy Spread ◽  
Site Specific ◽  
High Brightness ◽  
Source Characteristics

Abstract We present a review of the Low Temperature Ion Source (LoTIS): its aims, design, performance data collected to date, and focused spot size projections when integrated with a FIB. LoTIS provides a Cs+ beam that has been measured to have high brightness (> 107Am-2sr-1eV-1), and low-energy spread (< 0.5 eV). These source characteristics enable a prediction of subnm focused spot sizes. A FIB with the capabilities enabled by LoTIS would be well-suited to addressing FIB failure analysis tasks such as nanomachining, circuit edit, and site-specific SIMS.

Performance test of high brightness nano-aperture ion source

2017 ◽  
Vol 404 ◽  
pp. 52-57 ◽  
Author(s):  
Xinxin Xu ◽  
P. Santhana Raman ◽  
Rudy Pang ◽  
Nannan Liu ◽  
Anjam Khursheed ◽  
...  
Keyword(s):  
Performance Test ◽  
Ion Source ◽  
High Brightness
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