scholarly journals Modeling inter-particle magnetic correlations in magnetite nanoparticle assemblies using x-ray magnetic scattering data

AIP Advances ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 035033 ◽  
Author(s):  
Johnathon Rackham ◽  
Brittni Newbold ◽  
Steve Kotter ◽  
Dallin Smith ◽  
Dalton Griner ◽  
...  
RSC Advances ◽  
2021 ◽  
Vol 11 (15) ◽  
pp. 8619-8627
Author(s):  
I. E. Grey ◽  
P. Bordet ◽  
N. C. Wilson

Amorphous titania samples prepared by ammonia solution neutralization of titanyl sulphate have been characterized by chemical and thermal analyses, and with reciprocal-space and real-space fitting of wide-angle synchrotron X-ray scattering data.


2017 ◽  
Vol 95 (20) ◽  
Author(s):  
M. Ramakrishnan ◽  
Y. Joly ◽  
Y. W. Windsor ◽  
L. Rettig ◽  
A. Alberca ◽  
...  

2012 ◽  
Vol 208 (1) ◽  
pp. 157-164 ◽  
Author(s):  
M. G. Kim ◽  
A. Kreyssig ◽  
Y. B. Lee ◽  
R. J. McQueeney ◽  
B. N. Harmon ◽  
...  
Keyword(s):  

2006 ◽  
Vol 73 (18) ◽  
Author(s):  
M. Georgescu ◽  
M. Klokkenburg ◽  
B. H. Erné ◽  
P. Liljeroth ◽  
D. Vanmaekelbergh ◽  
...  

2006 ◽  
Vol 39 (2) ◽  
pp. 262-266 ◽  
Author(s):  
R. J. Davies

Synchrotron sources offer high-brilliance X-ray beams which are ideal for spatially and time-resolved studies. Large amounts of wide- and small-angle X-ray scattering data can now be generated rapidly, for example, during routine scanning experiments. Consequently, the analysis of the large data sets produced has become a complex and pressing issue. Even relatively simple analyses become difficult when a single data set can contain many thousands of individual diffraction patterns. This article reports on a new software application for the automated analysis of scattering intensity profiles. It is capable of batch-processing thousands of individual data files without user intervention. Diffraction data can be fitted using a combination of background functions and non-linear peak functions. To compliment the batch-wise operation mode, the software includes several specialist algorithms to ensure that the results obtained are reliable. These include peak-tracking, artefact removal, function elimination and spread-estimate fitting. Furthermore, as well as non-linear fitting, the software can calculate integrated intensities and selected orientation parameters.


2013 ◽  
Vol 23 (6) ◽  
pp. 319-320
Author(s):  
Vladimir V. Volkov ◽  
Victor A. Lapuk ◽  
Deniza I. Chekrygina ◽  
Elena Yu. Varlamova ◽  
Artem V. Chekushin

2018 ◽  
Vol 122 (45) ◽  
pp. 10320-10329 ◽  
Author(s):  
Amin Sadeghpour ◽  
Marjorie Ladd Parada ◽  
Josélio Vieira ◽  
Megan Povey ◽  
Michael Rappolt

1995 ◽  
Author(s):  
Yibin Zheng ◽  
Peter C. Doerschuk ◽  
John E. Johnson

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