Local permittivity measurement of dielectric materials based on the non-contact force curve of microwave atomic force microscopy

2019 ◽  
Vol 90 (3) ◽  
pp. 033706
Author(s):  
Bo Tong ◽  
Minji Zhao ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
Yang Ju
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Force ◽  
Dielectric Materials ◽  
Force Curve ◽  
Force Microscopy ◽  
Permittivity Measurement ◽  
Atomic Force

Comparison of atomic force microscopy force curve and solvation structure studied by integral equation theory

2021 ◽  
Vol 154 (16) ◽  
pp. 164702
Author(s):  
Kota Hashimoto ◽  
Ken-ichi Amano ◽  
Naoya Nishi ◽  
Hiroshi Onishi ◽  
Tetsuo Sakka
Keyword(s):  
Integral Equation ◽  
Atomic Force Microscopy ◽  
Integral Equation Theory ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solvation Structure

Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods

2021 ◽  
Author(s):  
Berkin Uluutku ◽  
Santiago D. Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Signal To Noise Ratio ◽  
Gaussian Model ◽  
Force Curve ◽  
Simple Method ◽  
Force Microscopy ◽  
Electromagnetic Interactions ◽  
Atomic Force ◽  
Mechanical Deformations ◽  
Specialized Hardware

Abstract Quantitative measurement of the probe-sample interaction forces as a function of distance and time during imaging has been at the forefront of atomic force microscopy (AFM) research. This type of information is extremely valuable for understanding the material response to a variety of stimuli and interactions, such as mechanical deformations that vary in magnitude and rate of application, chemical interactions, or electromagnetic interactions. A variety of methods for performing such measurements simultaneously with topographical imaging is available, including methods based on Fourier analysis. Within these methods, reconstruction of the tip-sample force curve generally requires measurement of a large number of harmonics of the probe oscillation, which presents challenges such as the need for specialized hardware, low signal-to-noise ratio, and the need for extensive user expertise. In this paper, we present a simple method to perform a Gaussian-model-based fit of the tip-sample force curve across the surface, simultaneously with imaging, which requires measurement of only the first two or three harmonics for elastic materials. While such an approach only offers an approximate representation of the force curve, it can be highly accurate and fast, and has low instrumentation requirements, such that it can be relatively simple to implement on most commercial AFM setups.

Determination of Single-Bond Forces from Contact Force Variances in Atomic Force Microscopy

Langmuir ◽  
1996 ◽  
Vol 12 (5) ◽  
pp. 1291-1295 ◽  
Author(s):  
John M. Williams ◽  
Taejoon Han ◽  
Thomas P. Beebe
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Force ◽  
Single Bond ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Number density distribution of solvent molecules on a substrate: a transform theory for atomic force microscopy

2016 ◽  
Vol 18 (23) ◽  
pp. 15534-15544 ◽  
Author(s):  
Ken-ichi Amano ◽  
Yunfeng Liang ◽  
Keisuke Miyazawa ◽  
Kazuya Kobayashi ◽  
Kota Hashimoto ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Density Distribution ◽  
Number Density ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hydration Structure ◽  
Solvent Molecules

A theory that transforms the force curve into a hydration structure is derived, and the transformation is demonstrated.

Studies on Improving PP Fiber Reinforced Concrete

2011 ◽  
Vol 250-253 ◽  
pp. 678-681 ◽  
Author(s):  
Liang Hsing Chou ◽  
Chun Ku Lu ◽  
Maw Tien Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Reinforced Concrete ◽  
Surface Property ◽  
Interaction Force ◽  
Fiber Reinforced Concrete ◽  
Fiber Reinforced ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polar Probe

Grafting method was used to modify polypropylene (PP) fiber to enhance the fiber reinforced concrete in this study. Polyacrylamide (PAM) was grafted onto PP surface by UV radiation using benzophenone (BP) as a photoinitiator. The microstructure of PP, and the interaction force between PP and the polar probe were observed with an atomic force microscopy (AFM). Experimental results showed that the roughness of PAM-grafted PP surface decreased significantly in comparison with that of the untreated PP surface. In addition, instead of smooth force curve as that of the untreated PP, the interaction between the probe and PAM-grafted PP surface appeared an oscillation. The above results gave the evidences that PAM had been successfully grafted onto the PP surface as discussed . The high hydrophilic property of PAM modifies the surface property of PP fiber and strengthens PP fiber reinforced concrete.

Atomic Force Michoscxpy-Feasibility for Materials Research.

1987 ◽  
Vol 111 ◽  
Author(s):  
P. J. Bryant ◽  
R. Yang ◽  
R. Miller
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Materials ◽  
Spring Constant ◽  
Force Microscopy ◽  
Surface Areas ◽  
Atomic Force ◽  
Show Evidence ◽  
Materials Research ◽  
The Subject

AbstractThe applicability of atomic force microscopy (AFM) to both conductive and dielectric materials is the subject of this study. A representative conductor, Cu, and two dielectrics, mica and selenite, were examined. Microstructure and single lamellar steps were resolved. Surface areas on Cu and mica generated reproducible images when scanned repeatedly. There was no evidence of damage to the probe or the sample as a result of the AFM investigations. Selenite did show evidence of change after repeated scans with an AFM lever of 12 N/m spring constant exerting a 10−6N force.

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