scholarly journals Observation of charge density waves in free-standing 1T-TaSe2 monolayers by transmission electron microscopy

2018 ◽  
Vol 113 (17) ◽  
pp. 173103 ◽  
Author(s):  
P. C. Börner ◽  
M. K. Kinyanjui ◽  
T. Björkman ◽  
T. Lehnert ◽  
A. V. Krasheninnikov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Charge Density ◽  
Charge Density Waves ◽  
Density Waves ◽  
Free Standing ◽  
Transmission Electron

Laser-Induced Oxidation and Crystallization of Thin Amorphous Sputtered Cr Films

1983 ◽  
Vol 29 ◽  
Author(s):  
M. I. Birjega ◽  
C. A. Constantin ◽  
M. Dinescu ◽  
I. Th. Florescu ◽  
I. N. Mihailescu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Laser Irradiation ◽  
Dwell Time ◽  
Free Standing ◽  
Transmission Electron Diffraction ◽  
Oxidation Processes ◽  
Transmission Electron ◽  
Power Densities

ABSTRACTThe crystallization and oxidation processes of thin, free-standing (FS), sputtered Cr films under the action of cw CO2 laser irradiation were studied by transmission electron microscopy (TEM) and transmission electron diffraction (TED). The crystallization is induced at power densities above 28.65 W cm−2, dwell time of 1 s, and the oxidation at power densities of 48.1 W cm−2 and longer dwell times.

scholarly journals Distinctive stability of a free-standing monolayer clay mineral nanosheet via transmission electron microscopy

2020 ◽  
Vol 22 (43) ◽  
pp. 25095-25102
Author(s):  
Ikumi Akita ◽  
Yohei Ishida ◽  
Tetsu Yonezawa
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Clay Mineral ◽  
Free Standing ◽  
Transmission Electron

The distinctive stability of the monolayer clay mineral demonstrated by electron diffraction.

Dislocation Revelation and Categorization for Thick Free-Standing GaN Substrates Grown by HVPE

2017 ◽  
Vol 897 ◽  
pp. 707-710 ◽  
Author(s):  
Yong Zhao Yao ◽  
Yukari Ishikawa ◽  
Yoshihiro Sugawara ◽  
Daisaku Yokoe ◽  
Masaki Sudo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Threading Dislocations ◽  
Etch Pits ◽  
Free Standing ◽  
Etch Pit ◽  
Transmission Electron

Threading dislocations (TDs) in an HVPE-grown free-standing GaN substrate have been studied by means of etch pit method using molten KOH+Na2O2 solution, cathodoluminescence (CL) mapping and transmission electron microscopy (TEM). We have focused on the correlation between (1) Burgers vectors of TDs, (2) their appearances as dark spots in CL image, and (3) geometries of corresponding etch pits. Based on the above results, dislocation categorization for GaN by using etch pits or CL is discussed.

Understanding the graphitization and growth of free-standing nanocrystalline graphene using in situ transmission electron microscopy

Nanoscale ◽  
2017 ◽  
Vol 9 (35) ◽  
pp. 12835-12842 ◽  
Author(s):  
C. N. Shyam Kumar ◽  
Venkata Sai Kiran Chakravadhanula ◽  
Adnan Riaz ◽  
Simone Dehm ◽  
Di Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Domain Growth ◽  
Free Standing ◽  
Tem Analysis ◽  
Thermally Induced ◽  
Transmission Electron

In situ TEM analysis of the thermally induced graphitization and domain growth of free-standing nanocrystalline graphene thin films.

Sign in / Sign up

Export Citation Format

Share Document