Growth of Rayleigh instability in a Hall thruster channel having dust in exit region

Hitendra K. Malik; Jasvendra Tyagi; Dimple Sharma

doi:10.1063/1.5050688

Growth of Rayleigh instability in a Hall thruster channel having dust in exit region

AIP Advances ◽

10.1063/1.5050688 ◽

2019 ◽

Vol 9 (5) ◽

pp. 055220 ◽

Cited By ~ 3

Author(s):

Hitendra K. Malik ◽

Jasvendra Tyagi ◽

Dimple Sharma

Keyword(s):

Hall Thruster ◽

Rayleigh Instability ◽

Exit Region

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Role of ionization and electron drift velocity profile to Rayleigh instability in a Hall thruster plasma

Journal of Applied Physics ◽

10.1063/1.4733339 ◽

2012 ◽

Vol 112 (1) ◽

pp. 013307 ◽

Cited By ~ 13

Author(s):

Sukhmander Singh ◽

Hitendra K. Malik

Keyword(s):

Velocity Profile ◽

Drift Velocity ◽

Electron Drift Velocity ◽

Hall Thruster ◽

Electron Drift ◽

Rayleigh Instability

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Conditions and growth rate of Rayleigh instability in a Hall thruster under the effect of ion temperature

Physical Review E ◽

10.1103/physreve.83.036406 ◽

2011 ◽

Vol 83 (3) ◽

Cited By ~ 21

Author(s):

Hitendra K. Malik ◽

Sukhmander Singh

Keyword(s):

Growth Rate ◽

Hall Thruster ◽

Rayleigh Instability ◽

Ion Temperature

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In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121685 ◽

1992 ◽

Vol 50 (1) ◽

pp. 256-257

Author(s):

Tai D. Nguyen ◽

Ronald Gronsky ◽

Jeffrey B. Kortright

Keyword(s):

Layered Structure ◽

Driving Force ◽

High Energy ◽

Superior Performance ◽

In Situ Tem ◽

Rayleigh Instability ◽

Practical Applications ◽

Transmission Electron ◽

Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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