A fast scanning ion conductance microscopy imaging method using compressive sensing and low-discrepancy sequences

2018 ◽  
Vol 89 (11) ◽  
pp. 113709 ◽  
Author(s):  
Zhiwu Wang ◽  
Jian Zhuang ◽  
Zijun Gao ◽  
Xiaobo Liao
Keyword(s):  
Compressive Sensing ◽  
Imaging Method ◽  
Microscopy Imaging ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Low Discrepancy Sequences

Study on a Rapid Imaging Method for Scanning Ion Conductance Microscopy Using a Double-Barreled Theta Pipette

2020 ◽  
Vol 92 (24) ◽  
pp. 15789-15798
Author(s):  
Jian Zhuang ◽  
Heng Yan ◽  
Qiangqiang Zheng ◽  
Tingkai Wang ◽  
Xiaobo Liao
Keyword(s):  
Imaging Method ◽  
Rapid Imaging ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy

scholarly journals High-Throughput Nanocapillary Filling Enabled by Microwave Radiation for Scanning Ion Conductance Microscopy Imaging

2020 ◽  
Vol 3 (8) ◽  
pp. 7829-7834 ◽  
Author(s):  
Vytautas Navikas ◽  
Samuel M. Leitão ◽  
Sanjin Marion ◽  
Sebastian James Davis ◽  
Barney Drake ◽  
...  
Keyword(s):  
Microwave Radiation ◽  
High Throughput ◽  
Microscopy Imaging ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy

Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method

2018 ◽  
Vol 24 (3) ◽  
pp. 264-276 ◽  
Author(s):  
Jian Zhuang ◽  
Zhiwu Wang ◽  
Zeqing Li ◽  
Pengbo Liang ◽  
Mugubo Vincent
Keyword(s):  
High Speed ◽  
Imaging System ◽  
Scanning Speed ◽  
Transverse Motion ◽  
Acquisition Time ◽  
Microscopy Imaging ◽  
Ion Conductance ◽  
Scanning Method ◽  
Scanning Ion Conductance Microscopy

AbstractTo solve extended acquisition time issues inherent in the conventional hopping-scanning mode of scanning ion-conductance microscopy (SICM), a new transverse-fast scanning mode (TFSM) is proposed. Because the transverse motion in SICM is not the detection direction and therefore presents no collision problem, it has the ability to move at high speed. In TSFM, the SICM probe gradually descends in the vertical/detection direction and rapidly scans in the transverse/nondetection direction. Further, the highest point that decides the hopping height of each scanning line can be quickly obtained. In conventional hopping mode, however, the hopping height is artificially set without a priori knowledge and is typically very large. Consequently, TFSM greatly improves the scanning speed of the SICM imaging system by effectively reducing the hopping height of each pixel. This study verifies the feasibility of this novel scanning method via theoretical analysis and experimental study, and compares the speed and quality of the scanning images obtained in the TFSM with that of the conventional hopping mode. The experimental results indicate that the TFSM method has a faster scanning speed than other SICM scanning methods while maintaining the quality of the images. Therefore, TFSM provides the possibility to quickly obtain high-resolution three-dimensional topographical images of extremely complex samples.

Dual-stage piezo nanopositioner for high-speed ion conductance microscopy imaging

2020 ◽  
Vol 28 (10) ◽  
pp. 2203-2214
Author(s):  
Jian ZHUANG ◽  
◽  
Zhi-wu WANG ◽  
Xiao-bo LIAO ◽  
Keyword(s):  
High Speed ◽  
Microscopy Imaging ◽  
Ion Conductance ◽  
Dual Stage
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