Two dimensionally space-resolved electron temperature measurement of fusion plasma by x-ray monochromatic imaging method

1996 ◽  
Author(s):  
K. Fujita ◽  
H. Nishimura ◽  
I. Uschmann ◽  
E. Förster ◽  
H. Takabe ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Temperature Measurement ◽  
Imaging Method ◽  
Fusion Plasma ◽  
X Ray ◽  
Monochromatic Imaging

scholarly journals Electron temperature measurement of low-energy laser produced plasma using iso-electronic x-ray spectroscopy

2003 ◽  
Vol 52 (2) ◽  
pp. 411
Author(s):  
Yang Jia-Min ◽  
Ding Yao-Nan ◽  
Chen Bo ◽  
Zheng Zhi-Jian ◽  
Yang Guo-Hong ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Temperature Measurement ◽  
Low Energy ◽  
X Ray ◽  
Laser Produced Plasma ◽  
Energy Laser ◽  
Low Energy Laser

Calibration of a two-color soft x-ray diagnostic for electron temperature measurement

2016 ◽  
Vol 87 (11) ◽  
pp. 11E332 ◽  
Author(s):  
L. M. Reusch ◽  
D. J. Den Hartog ◽  
P. Franz ◽  
J. Goetz ◽  
M. B. McGarry ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Temperature Measurement ◽  
X Ray

Temperature measurement of asymmetrical pulsed TIG arc plasma by multidirectional monochromatic imaging method

2014 ◽  
Vol 59 (2) ◽  
pp. 283-293 ◽  
Author(s):  
Kazufumi Nomura ◽  
Takashi Kishi ◽  
Kentaro Shirai ◽  
Yoshinori Hirata ◽  
Kotaro Kataoka
Keyword(s):  
Temperature Measurement ◽  
Imaging Method ◽  
Arc Plasma ◽  
Monochromatic Imaging

Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

2000 ◽  
Vol 71 (4) ◽  
pp. 1671-1674
Author(s):  
S. Lee ◽  
S. Duorah ◽  
A. Ejiri ◽  
H. Iguchi ◽  
A. Fujisawa ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Temperature Measurement ◽  
Fast Electron ◽  
X Ray ◽  
Multilayer Mirror

scholarly journals Coherence tomography with broad bandwidth extreme ultraviolet and soft X-ray radiation

2021 ◽  
Vol 127 (4) ◽  
Author(s):  
S. Skruszewicz ◽  
S. Fuchs ◽  
J. J. Abel ◽  
J. Nathanael ◽  
J. Reinhard ◽  
...  
Keyword(s):  
Optical Coherence Tomography ◽  
Near Infrared ◽  
Extreme Ultraviolet ◽  
Infrared Light ◽  
Imaging Method ◽  
Optical Coherence ◽  
Axial Resolution ◽  
Cross Sectional ◽  
X Ray ◽  
Broad Bandwidth

AbstractWe present an overview of recent results on optical coherence tomography with the use of extreme ultraviolet and soft X-ray radiation (XCT). XCT is a cross-sectional imaging method that has emerged as a derivative of optical coherence tomography (OCT). In contrast to OCT, which typically uses near-infrared light, XCT utilizes broad bandwidth extreme ultraviolet (XUV) and soft X-ray (SXR) radiation (Fuchs et al in Sci Rep 6:20658, 2016). As in OCT, XCT’s axial resolution only scales with the coherence length of the light source. Thus, an axial resolution down to the nanometer range can be achieved. This is an improvement of up to three orders of magnitude in comparison to OCT. XCT measures the reflected spectrum in a common-path interferometric setup to retrieve the axial structure of nanometer-sized samples. The technique has been demonstrated with broad bandwidth XUV/SXR radiation from synchrotron facilities and recently with compact laboratory-based laser-driven sources. Axial resolutions down to 2.2 nm have been achieved experimentally. XCT has potential applications in three-dimensional imaging of silicon-based semiconductors, lithography masks, and layered structures like XUV mirrors and solar cells.

scholarly journals A Method to Improve Electron Density Measurement of Cone-Beam CT Using Dual Energy Technique

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Kuo Men ◽  
Jian-Rong Dai ◽  
Ming-Hui Li ◽  
Xin-Yuan Chen ◽  
Ke Zhang ◽  
...  
Keyword(s):  
Electron Density ◽  
Cone Beam Ct ◽  
Density Measurement ◽  
Dual Energy ◽  
Cone Beam ◽  
Imaging Method ◽  
Basis Material ◽  
X Ray ◽  
Dual Energy Imaging ◽  
Set Up

Purpose. To develop a dual energy imaging method to improve the accuracy of electron density measurement with a cone-beam CT (CBCT) device.Materials and Methods. The imaging system is the XVI CBCT system on Elekta Synergy linac. Projection data were acquired with the high and low energy X-ray, respectively, to set up a basis material decomposition model. Virtual phantom simulation and phantoms experiments were carried out for quantitative evaluation of the method. Phantoms were also scanned twice with the high and low energy X-ray, respectively. The data were decomposed into projections of the two basis material coefficients according to the model set up earlier. The two sets of decomposed projections were used to reconstruct CBCT images of the basis material coefficients. Then, the images of electron densities were calculated with these CBCT images.Results. The difference between the calculated and theoretical values was within 2% and the correlation coefficient of them was about 1.0. The dual energy imaging method obtained more accurate electron density values and reduced the beam hardening artifacts obviously.Conclusion. A novel dual energy CBCT imaging method to calculate the electron densities was developed. It can acquire more accurate values and provide a platform potentially for dose calculation.

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

2014 ◽  
Vol 47 (6) ◽  
pp. 1882-1888 ◽  
Author(s):  
J. Hilhorst ◽  
F. Marschall ◽  
T. N. Tran Thi ◽  
A. Last ◽  
T. U. Schülli
Keyword(s):  
Imaging Techniques ◽  
Light And Electron Microscopy ◽  
Added Value ◽  
Acquisition Time ◽  
Imaging Method ◽  
X Ray Diffraction ◽  
Polymeric Compound ◽  
Full Field ◽  
X Ray ◽  
Diffraction Imaging

Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

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