Note: A compact low-vibration high-performance optical shutter for precision measurement experiments

2018 ◽  
Vol 89 (9) ◽  
pp. 096111 ◽  
Author(s):  
Pan-Wei Huang ◽  
Biao Tang ◽  
Zong-Yuan Xiong ◽  
Jia-Qi Zhong ◽  
Jin Wang ◽  
...  
Keyword(s):  
Precision Measurement ◽  
High Performance ◽  
Optical Shutter

scholarly journals Optimization Design on a High-performance Magnetic Shielding Barrel for Atomic Magnetometer Measurement Application

2022 ◽  
Vol 2160 (1) ◽  
pp. 012033
Author(s):  
Xiaoxuan Xie ◽  
Xiangyang Zhou
Keyword(s):  
Magnetic Field ◽  
Precision Measurement ◽  
High Performance ◽  
Optimization Design ◽  
Magnetic Shielding ◽  
High Precision Measurement ◽  
Number Of Layers ◽  
Optimal Distance ◽  
Shielding Factor ◽  
Residual Magnetic Field

Abstract The ultra-high-precision measurement of the atomic magnetometer is largely restricted by the size of its working magnetic field. In order to reduce the residual magnetic field as much as possible, this article carried out the research on the methods to improve the shielding performance. Firstly, the axial shielding factor that limits the shielding performance of the magnetic shielding barrel was derived with various parameters including the radius, length, thickness, number of layers, distance between adjacent layers, etc. of the magnetic shielding barrel. Secondly, simulation was carried out to verify the correctness of the formula. Simulation shows that the shielding performance of the magnetic shielding barrel decreases with the size of magnetic shielding barrel increase. Besides, with the increase of the distance between two adjacent spacing layers, the shielding performance first increases rapidly and then gradually decreases, indicating that the optimal distance between adjacent layers is 9mm. Especially, the performance of the magnetic shielding barrel improves significantly as the layer thickness and number of layers increase. Experimental results show that the internal remanence of the three-layer magnetic shielding barrel is less than 1nT, and the available axial length of homogeneity range is greater than 200mm.

Application of high performance DC SQUIDs in precision measurement technique

1995 ◽  
Vol 5 (2) ◽  
pp. 2152-2155 ◽  
Author(s):  
W. Vodel ◽  
H. Koch ◽  
P. Seidel ◽  
K. Bluthner ◽  
P. Weber
Keyword(s):  
Measurement Technique ◽  
Precision Measurement ◽  
High Performance

High-Performance Electrochromic Optical Shutter Based on Fluoran Dye for Visibility Enhancement of Augmented Reality Display

2018 ◽  
Vol 6 (11) ◽  
pp. 1701382 ◽  
Author(s):  
Gyeong Woo Kim ◽  
Yong Cheol Kim ◽  
Ik Jang Ko ◽  
Jin Hwan Park ◽  
Hyeong Woo Bae ◽  
...  
Keyword(s):  
Augmented Reality ◽  
High Performance ◽  
Optical Shutter ◽  
Visibility Enhancement

scholarly journals Composite resistor standard for calibration of measuring transducers in laboratory conditions

2016 ◽  
Vol 13 (1) ◽  
pp. 71-82
Author(s):  
Marjan Urekar ◽  
Marina Bulat ◽  
Bojan Vujicic ◽  
Dragan Pejic
Keyword(s):  
Precision Measurement ◽  
High Performance ◽  
Voltage Drop ◽  
Self Heating ◽  
Stable Temperature ◽  
Measurement Results ◽  
Resistance Fluctuations ◽  
Dc Current ◽  
Source Of Error ◽  
Standard Prototype

Calibration of measuring transducers for precision measurement is done by measuring voltage drop at the resistor standard, produced by output dc current proportional to the input measured value. Resistance fluctuations due to the temperature coefficient of the resistor standard are minor, thanks to the stable temperature conditions in laboratory environment. This fact brings the need to calculate the effect of resistor self-heating on its resistance. This thermal effect, produced by the flow of current through the resistor, is often disregarded. For the precise measurements this can be a significant source of error and must be quantified. This paper describes mathematical model of measurement error, resistor self-heating coefficient is defined, as it?s not usually given in product datasheets. The effect on measurement results is given in detail. Composite resistor standard prototype is described, made from off-the-shelf mass produced components, calculated and hand selected to cancel the self-heating coefficient effects. The prototype is compared to the existing commercially available high performance resistor standard.

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

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