Dielectric function of polycrystalline gold films: Effects of grain boundary and temperature

2018 ◽  
Vol 124 (16) ◽  
pp. 165301 ◽  
Author(s):  
Shangyu Zhang ◽  
Yanbo Pei ◽  
Linhua Liu
Keyword(s):  
Grain Boundary ◽  
Dielectric Function ◽  
Gold Films ◽  
Polycrystalline Gold

On the role of tin underlays for the prevention of thermal grooving in thin gold films

1986 ◽  
Vol 44 ◽  
pp. 732-733
Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff
Keyword(s):  
Thin Film ◽  
Free Surface ◽  
Grain Boundary ◽  
Beneficial Effect ◽  
Failure Mechanism ◽  
Failure Mechanisms ◽  
Distinct Advantage ◽  
Gold Films ◽  
Gold Thin Film

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.

Study of rough growth fronts of evaporated polycrystalline gold films

2004 ◽  
Vol 22 (4) ◽  
pp. 1767-1772 ◽  
Author(s):  
C. Munuera ◽  
J. A. Aznárez ◽  
E. Rodrı́guez-Cañas ◽  
A. I. Oliva ◽  
M. Aguilar ◽  
...  
Keyword(s):  
Gold Films ◽  
Polycrystalline Gold

Tem Study of Yielding in Polycrystalline Gold Thin Films

1997 ◽  
Vol 505 ◽  
Author(s):  
Kwame Owusu-Boahen ◽  
Alexander H. King
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Size ◽  
Rock Salt ◽  
Gold Films ◽  
Plastic Yielding ◽  
Transmission Electron ◽  
Mean Grain Size ◽  
Polycrystalline Gold ◽  
Individual Grains

ABSTRACTWe have used transmission electron microscopy (TEM) to study the microstructure of thin gold films which were grown on 〈100〉 rock salt. The samples were annealed on the rock salt substrate or on a gold TEM specimen grid. Films annealed on rock salt had a larger mean grain size than those annealed on TEM grids. All of the annealed films have a 〈111〉 preferred orientation. Several cracks are observed in the film annealed on rock salt. Plastic yielding of the film was identified by the presence of dislocations, and is caused by tensile stress derived from grain growth. In spite of the uniform texture of the films, the observed dislocations were concentrated only in some individual grains, while their surrounding grains remained dislocation-free. Yielded grains showed no difference of orientation that would lead to higher Schmid factors, so other predictors of yielding must be considered.

scholarly journals Mechanical Properties of Evaporated Gold Films. Hard Substrate Effect Correction

2008 ◽  
Vol 1086 ◽  
Author(s):  
Ke Du ◽  
Xiaolu Pang ◽  
Chi Chen ◽  
Alex A. Volinsky
Keyword(s):  
Mechanical Properties ◽  
Indentation Depth ◽  
Gold Film ◽  
Gold Films ◽  
Substrate Effect ◽  
Berkovich Indenter ◽  
Film Hardness ◽  
Polycrystalline Gold ◽  
Area Variation ◽  
Hard Substrates

AbstractNanoindentation tests using the Berkovich indenter tip were performed on 50 and 200 nm thick polycrystalline gold films deposited on hard substrates. Gold film hardness increased with the indentation depth due to the influence of the substrate. A procedure based on the Joslin-Oliver method was introduced to correct for the substrate effect. The method utilizes the fact that the measured elastic modulus does not change significantly with the indentation depth, which allows reducing the contact area variation used in the hardness calculation.

Texture of Gold-Palladium Couples

1997 ◽  
Vol 472 ◽  
Author(s):  
Young S. Chung ◽  
Keenan Evans ◽  
William Glaunsinger
Keyword(s):  
Thin Films ◽  
Silicon Dioxide ◽  
Seed Layer ◽  
Substrate Surface ◽  
Diffusion Mechanism ◽  
Strong Dependence ◽  
Gold Films ◽  
X Ray Diffraction ◽  
Pole Figures ◽  
Polycrystalline Gold

ABSTRACTThe crystal textures of polycrystalline films of gold-palladium couples on an oxidized silicon (100) substrates were investigated via x-ray diffraction (XRD) pole figures. Studies were performed on both as-deposited and thermally annealed films. Scanning electron microscopy (SEM) was used to examine the microstructures of the seed layer thin films as deposited. The {111} texture formation of gold-palladium thin film couples displayed a strong dependence on the nature of the underlying seed layer. Gold films deposited on a palladium seed layer revealed much less degree of {111} texture, than gold films deposited directly on a silicon dioxide surface. In contrast, palladium films deposited on polycrystalline gold films showed a higher degree of {111} texture, compared to palladium films deposited directly on silicon dioxide. The {111} texture of annealed gold-palladium alloy thin films was greater for palladium on gold than for gold on palladium. These results are interpreted in terms of the gold-palladium diffusion mechanism and the interaction of the condensing metals with the oxygens of the SiO2 substrate surface.

Suppressed Thermal Conductivity in Polycrystalline Gold Nanofilm: The Effect of Grain Boundary and Substrate

2021 ◽  
Vol 38 (2) ◽  
pp. 027202
Author(s):  
Lan Dong ◽  
Xiangshui Wu ◽  
Yue Hu ◽  
Xiangfan Xu ◽  
Hua Bao
Keyword(s):  
Thermal Conductivity ◽  
Grain Boundary ◽  
Polycrystalline Gold

The electrical resistivity of gold films

1982 ◽  
Vol 304 (1486) ◽  
pp. 365-396 ◽  
Keyword(s):  
Grain Boundary ◽  
High Energy ◽  
Convincing Evidence ◽  
Grain Structure ◽  
Surface Scattering ◽  
Dependent Data ◽  
Gold Films ◽  
Temperature Dependent ◽  
Reflexion Coefficient ◽  
Microscopic Surface

We present measurements of the d.c. electrical resistance of three classes of pure epitaxial gold films in the thickness range 30 to 900 nm. The combination of diverse morphological techniques with temperature-dependent data from 2 to 300 K enables us to apply a new theory based on those of Mayadas and Shatzkes for grain-boundary scattering, and of Soffer for surface scattering. Gold, evaporated and annealed on mica substrates, produced (111) films which gave a mean microscopic surface roughness to Fermi wavelength ratio, r, of 0.05 and a grain-boundary reflexion coefficient, Rg, of 0.45. On KBr substrates, samples, prepared similarly, formed two distinct types of (100) film. Use of reflexion high energy electron diffraction and electron microscopy showed that the grain structure of these types of film differed; however, both gave an r of 0.1. An R g of 0.10 was determined for one type but remained unknown for the other. Our results show how previous workers, often relying on the validity of Fuchs’s theory and the misapplication thereof, have failed to present convincing evidence for specular surface scattering. We demonstrate the necessity for, experimentally, morphological observations and measurements over a wide temperature range, and, theoretically, the use of a method that combines the effects of both grain-boundary and angular-dependent surface scattering.

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