A study of irradiation effects in TiO2 using molecular dynamics simulation and complementary in situ transmission electron microscopy

2018 ◽  
Vol 124 (9) ◽  
pp. 095901 ◽  
Author(s):  
Benjamin J. Cowen ◽  
Mohamed S. El-Genk ◽  
Khalid Hattar ◽  
Samuel A. Briggs
Keyword(s):  
Electron Microscopy ◽  
Molecular Dynamics ◽  
Transmission Electron Microscopy ◽  
Molecular Dynamics Simulation ◽  
Dynamics Simulation ◽  
Irradiation Effects ◽  
Transmission Electron

Ion Irradiation Effects in Synthetic Garnets Incorporating Actinides

2002 ◽  
Vol 713 ◽  
Author(s):  
Satoshi Utsunomiya ◽  
Lu-Min Wang ◽  
Sergey Yudintsev ◽  
Rodney C. Ewing
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Irradiation ◽  
Atomic Mass ◽  
Irradiation Effects ◽  
Temperature Range ◽  
Transmission Electron

ABSTRACTRadiation durability of garnet [A3B2(XO4)3; Ia3d; Z=8] has been examined by 1.0 MeV Kr2+ irradiation with in situ transmission electron microscopy over the temperature range of 50 to 1070 K. The targets were five synthetic garnets incorporating various contents of actinides and andradite, Ca3Fe2Si3O12. The synthetic garnets were silicates (N series) and ferrate-aluminate series (G series).The critical amorphization temperatures (Tc), above which amorphization does not occur, were determined to be 1050 K for N77, 1130 K for N56, 1100 K for G3, 890 K for G4 and 1030 K for andradite. Tc of the synthetic garnets increased as the average atomic mass of the garnet increased. The maximum transferred energy by ballistic interaction was positively correlated to the atomic mass. The larger cascade size that formed due to the larger Emax might lead to the higher Tc.

scholarly journals The Effect of Displacement Cascades on Small Helium Bubbles in Aluminum and Gold

1994 ◽  
Vol 373 ◽  
Author(s):  
S E. Donnelly ◽  
R.C. Birtcher ◽  
C. Templier ◽  
R. Valizadeh ◽  
V. Vishnyakov
Keyword(s):  
Electron Microscopy ◽  
Molecular Dynamics ◽  
Transmission Electron Microscopy ◽  
Brownian Motion ◽  
Thermal Spike ◽  
Helium Bubbles ◽  
Thin Foils ◽  
Transmission Electron ◽  
Dynamics Simulations

AbstractThe evolution of individual helium bubbles in thin foils of gold and aluminum irradiated with 400 keV Ar+ and 200 keV Xe+ has been followed with in-situ transmission electron microscopy for a comparison between the effects of dilute (Al) and dense (Au) collision cascades. Bubble shrinkage in Al has been attributed to direct displacement of the gas out of the bubbles. Effects in Au, include the disappearance and Brownian motion of bubbles under irradiation, and are consistent with thermal spike processes seen in molecular dynamics simulations.

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition

1989 ◽  
Vol 47 ◽  
pp. 462-463
Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
High Vacuum ◽  
High Energy ◽  
Energy Electron ◽  
Ultra High Vacuum ◽  
Ex Situ ◽  
Transmission Electron

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.

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