Alternative edge illumination set-up for single-shot X-ray phase contrast imaging

2018 ◽  
Vol 124 (16) ◽  
pp. 164906 ◽  
Author(s):  
Cui Zhang ◽  
Xiaodong Pan ◽  
Hongjie Shang ◽  
Gongping Li
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray ◽  
Set Up

scholarly journals Evaluation of the Weighted Mean X-ray Energy for an Imaging System Via Propagation-Based Phase-Contrast Imaging

2020 ◽  
Vol 6 (7) ◽  
pp. 63
Author(s):  
Maria Seifert ◽  
Mareike Weule ◽  
Silvia Cipiccia ◽  
Silja Flenner ◽  
Johannes Hagemann ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Heavy Ion ◽  
High Energy ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
Weighted Mean ◽  
X Ray ◽  
Energy Laser ◽  
High Energy Laser

For imaging events of extremely short duration, like shock waves or explosions, it is necessary to be able to image the object with a single-shot exposure. A suitable setup is given by a laser-induced X-ray source such as the one that can be found at GSI (Helmholtzzentrum für Schwerionenforschung GmbH) in Darmstadt (Society for Heavy Ion Research), Germany. There, it is possible to direct a pulse from the high-energy laser Petawatt High Energy Laser for Heavy Ion eXperiments (PHELIX) on a tungsten wire to generate a picosecond polychromatic X-ray pulse, called backlighter. For grating-based single-shot phase-contrast imaging of shock waves or exploding wires, it is important to know the weighted mean energy of the X-ray spectrum for choosing a suitable setup. In propagation-based phase-contrast imaging the knowledge of the weighted mean energy is necessary to be able to reconstruct quantitative phase images of unknown objects. Hence, we developed a method to evaluate the weighted mean energy of the X-ray backlighter spectrum using propagation-based phase-contrast images. In a first step wave-field simulations are performed to verify the results. Furthermore, our evaluation is cross-checked with monochromatic synchrotron measurements with known energy at Diamond Light Source (DLS, Didcot, UK) for proof of concepts.

Single-shot grating-based x-ray differential phase contrast imaging with a modified analyzer grating

2017 ◽  
Vol 26 (10) ◽  
pp. 108701
Author(s):  
Chen-Xi Wei ◽  
Zhao Wu ◽  
Faiz Wali ◽  
Wen-Bin Wei ◽  
Yuan Bao ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray ◽  
Differential Phase ◽  
Differential Phase Contrast

Single-shot grating-based phase-contrast imaging of a micrometer sample at a laser-driven x-ray backlighter source

2021 ◽  
Vol 16 (06) ◽  
pp. P06021
Author(s):  
B. Akstaller ◽  
S. Schreiner ◽  
F. Hofmann ◽  
P. Meyer ◽  
P. Neumayer ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray

scholarly journals Sensitivity of edge illumination X-ray phase-contrast imaging

2014 ◽  
Vol 372 (2010) ◽  
pp. 20130128 ◽  
Author(s):  
P. C. Diemoz ◽  
M. Endrizzi ◽  
A. Bravin ◽  
I. K. Robinson ◽  
A. Olivo
Keyword(s):  
Theoretical Model ◽  
Phase Contrast ◽  
Angular Resolution ◽  
Signal To Noise Ratio ◽  
Phase Contrast Imaging ◽  
High Angular Resolution ◽  
Contrast Imaging ◽  
Signal To Noise ◽  
X Ray ◽  
Set Up

Recently, we developed a theoretical model that can predict the signal-to-noise ratio for edge-like features in phase-contrast images. This model was then applied for the estimation of the sensitivity of three different X-ray phase-contrast techniques: propagation-based imaging, analyser-based imaging and grating interferometry. We show here how the same formalism can be used also in the case of the edge illumination (EI) technique, providing results that are consistent with those of a recently developed method for the estimation of noise in the retrieved refraction image. The new model is then applied to calculate, in the case of a given synchrotron radiation set-up, the optimum positions of the pre-sample aperture and detector edge to maximize the sensitivity. Finally, an example of the extremely high angular resolution achievable with the EI technique is presented.

Quantitative evaluation of single-shot inline phase contrast imaging using an inverse compton x-ray source

2010 ◽  
Vol 97 (13) ◽  
pp. 134104 ◽  
Author(s):  
P. Oliva ◽  
M. Carpinelli ◽  
B. Golosio ◽  
P. Delogu ◽  
M. Endrizzi ◽  
...  
Keyword(s):  
Quantitative Evaluation ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray ◽  
Inverse Compton

scholarly journals Single shot x-ray phase contrast imaging using a direct conversion microstrip detector with single photon sensitivity

2016 ◽  
Vol 108 (23) ◽  
pp. 234102 ◽  
Author(s):  
M. Kagias ◽  
S. Cartier ◽  
Z. Wang ◽  
A. Bergamaschi ◽  
R. Dinapoli ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Single Photon ◽  
Direct Conversion ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray ◽  
Microstrip Detector

scholarly journals Development and Characterization of Two-Dimensional Gratings for Single-Shot X-ray Phase-Contrast Imaging

2018 ◽  
Vol 8 (3) ◽  
pp. 468 ◽  
Author(s):  
Margarita Zakharova ◽  
Vitor Vlnieska ◽  
Heike Fornasier ◽  
Martin Börner ◽  
Tomy dos Santos Rolo ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Two Dimensional ◽  
Contrast Imaging ◽  
X Ray

scholarly journals Single shot phase contrast imaging using laser-produced Betatron x-ray beams

2011 ◽  
Vol 36 (13) ◽  
pp. 2426 ◽  
Author(s):  
S. Fourmaux ◽  
S. Corde ◽  
K. Ta Phuoc ◽  
P. Lassonde ◽  
G. Lebrun ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Contrast Imaging ◽  
X Ray

Single-shot X-ray phase-contrast imaging using two-dimensional gratings

2012 ◽  
Author(s):  
Genta Sato ◽  
Hidenosuke Itoh ◽  
Kentaro Nagai ◽  
Takashi Nakamura ◽  
Kimiaki Yamaguchi ◽  
...  
Keyword(s):  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Single Shot ◽  
Two Dimensional ◽  
Contrast Imaging ◽  
X Ray
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