X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
2018 ◽
Vol 89
(10)
◽
pp. 10G127
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1989 ◽
Vol 47
◽
pp. 30-31
1992 ◽
Vol 25
(2)
◽
pp. 205-210
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2006 ◽
Vol 47
(3)
◽
pp. 558-562
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1991 ◽
Vol 251
◽
pp. 11-27
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