Evaluating the impact of thermal annealing on c-Si/Al2O3 interface: Correlating electronic properties to infrared absorption
2012 ◽
Vol 258
(7)
◽
pp. 2894-2900
◽
Keyword(s):
2004 ◽
Vol 66
(3)
◽
pp. 392-398
◽
Keyword(s):
2019 ◽
Vol 26
(4)
◽
pp. 1351-1358
◽
Keyword(s):