A 1-m non-resonant inelastic x-ray scattering spectrometer at BL15U, Shanghai Synchrotron Radiation Facility

2018 ◽  
Vol 89 (8) ◽  
pp. 085108 ◽  
Author(s):  
Dong-Dong Ni ◽  
Xu Kang ◽  
Shuai Yan ◽  
Xin-Chao Huang ◽  
Tao Xiong ◽  
...  
2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  

2016 ◽  
Vol 49 (5) ◽  
pp. 1428-1432 ◽  
Author(s):  
Na Li ◽  
Xiuhong Li ◽  
Yuzhu Wang ◽  
Guangfeng Liu ◽  
Ping Zhou ◽  
...  

The beamline BL19U2 is located in the Shanghai Synchrotron Radiation Facility (SSRF) and is its first beamline dedicated to biological material small-angle X-ray scattering (BioSAXS). The electrons come from an undulator which can provide high brilliance for the BL19U2 end stations. A double flat silicon crystal (111) monochromator is used in BL19U2, with a tunable monochromatic photon energy ranging from 7 to 15 keV. To meet the rapidly growing demands of crystallographers, biochemists and structural biologists, the BioSAXS beamline allows manual and automatic sample loading/unloading. A Pilatus 1M detector (Dectris) is employed for data collection, characterized by a high dynamic range and a short readout time. The highly automated data processing pipeline SASFLOW was integrated into BL19U2, with help from the BioSAXS group of the European Molecular Biology Laboratory (EMBL, Hamburg), which provides a user-friendly interface for data processing. The BL19U2 beamline was officially opened to users in March 2015. To date, feedback from users has been positive and the number of experimental proposals at BL19U2 is increasing. A description of the new BioSAXS beamline and the setup characteristics is given, together with examples of data obtained.


2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.


Soft Matter ◽  
2020 ◽  
Vol 16 (15) ◽  
pp. 3599-3612 ◽  
Author(s):  
Yuanfei Lin ◽  
Wei Chen ◽  
Lingpu Meng ◽  
Daoliang Wang ◽  
Liangbin Li

We review the recent advances in post-stretching processing of polymer films with in situ synchrotron radiation X-ray scattering.


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