scholarly journals All-optical nanoscale thermometry with silicon-vacancy centers in diamond

2018 ◽  
Vol 112 (20) ◽  
pp. 203102 ◽  
Author(s):  
Christian T. Nguyen ◽  
Ruffin E. Evans ◽  
Alp Sipahigil ◽  
Mihir K. Bhaskar ◽  
Denis D. Sukachev ◽  
...  
2014 ◽  
Vol 113 (26) ◽  
Author(s):  
Lachlan J. Rogers ◽  
Kay D. Jahnke ◽  
Mathias H. Metsch ◽  
Alp Sipahigil ◽  
Jan M. Binder ◽  
...  
Keyword(s):  

2019 ◽  
Vol 5 (5) ◽  
pp. eaav9180 ◽  
Author(s):  
Toan Trong Tran ◽  
Blake Regan ◽  
Evgeny A. Ekimov ◽  
Zhao Mu ◽  
Yu Zhou ◽  
...  

Color centers in solids are the fundamental constituents of a plethora of applications such as lasers, light-emitting diodes, and sensors, as well as the foundation of advanced quantum information and communication technologies. Their photoluminescence properties are usually studied under Stokes excitation, in which the emitted photons are at a lower energy than the excitation ones. In this work, we explore the opposite anti-Stokes process, where excitation is performed with lower-energy photons. We report that the process is sufficiently efficient to excite even a single quantum system—namely, the germanium-vacancy center in diamond. Consequently, we leverage the temperature-dependent, phonon-assisted mechanism to realize an all-optical nanoscale thermometry scheme that outperforms any homologous optical method used to date. Our results frame a promising approach for exploring fundamental light-matter interactions in isolated quantum systems and harness it toward the realization of practical nanoscale thermometry and sensing.


2016 ◽  
Vol 6 (3) ◽  
Author(s):  
D. Simin ◽  
V. A. Soltamov ◽  
A. V. Poshakinskiy ◽  
A. N. Anisimov ◽  
R. A. Babunts ◽  
...  

2016 ◽  
Vol 7 (1) ◽  
Author(s):  
Jonas Nils Becker ◽  
Johannes Görlitz ◽  
Carsten Arend ◽  
Matthew Markham ◽  
Christoph Becher

ACS Photonics ◽  
2019 ◽  
Vol 6 (6) ◽  
pp. 1387-1392 ◽  
Author(s):  
Sumin Choi ◽  
Viatcheslav N. Agafonov ◽  
Valery A. Davydov ◽  
Taras Plakhotnik

2014 ◽  
Vol 113 (26) ◽  
Author(s):  
Benjamin Pingault ◽  
Jonas N. Becker ◽  
Carsten H. H. Schulte ◽  
Carsten Arend ◽  
Christian Hepp ◽  
...  
Keyword(s):  

2018 ◽  
Vol 120 (5) ◽  
Author(s):  
Jonas N. Becker ◽  
Benjamin Pingault ◽  
David Groß ◽  
Mustafa Gündoğan ◽  
Nadezhda Kukharchyk ◽  
...  

Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.


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