scholarly journals Nanoscale quantification of intracellular element concentration by X-ray fluorescence microscopy combined with X-ray phase contrast nanotomography

2018 ◽  
Vol 112 (5) ◽  
pp. 053701 ◽  
Author(s):  
Chiara Gramaccioni ◽  
Yang Yang ◽  
Alessandra Procopio ◽  
Alexandra Pacureanu ◽  
Sylvain Bohic ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Phase Contrast ◽  
Element Concentration ◽  
X Ray

scholarly journals Nuclear incorporation of iron during the eukaryotic cell cycle

2016 ◽  
Vol 23 (6) ◽  
pp. 1490-1497 ◽  
Author(s):  
Ian Robinson ◽  
Yang Yang ◽  
Fucai Zhang ◽  
Christophe Lynch ◽  
Mohammed Yusuf ◽  
...  
Keyword(s):  
Cell Cycle ◽  
Fluorescence Microscopy ◽  
Phase Contrast ◽  
Eukaryotic Cell ◽  
Inhomogeneous Distribution ◽  
Cell Nuclei ◽  
X Ray ◽  
Microscopy Images ◽  
Different Levels

Scanning X-ray fluorescence microscopy has been used to probe the distribution of S, P and Fe within cell nuclei. Nuclei, which may have originated at different phases of the cell cycle, are found to show very different levels of Fe present with a strongly inhomogeneous distribution. P and S signals, presumably from DNA and associated nucleosomes, are high and relatively uniform across all the nuclei; these agree with X-ray phase contrast projection microscopy images of the same samples. Possible reasons for the Fe incorporation are discussed.

scholarly journals Combined use of hard X-ray phase contrast imaging and X-ray fluorescence microscopy for sub-cellular metal quantification

2012 ◽  
Vol 177 (2) ◽  
pp. 239-247 ◽  
Author(s):  
Ewelina Kosior ◽  
Sylvain Bohic ◽  
Heikki Suhonen ◽  
Richard Ortega ◽  
Guillaume Devès ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Contrast Imaging ◽  
X Ray ◽  
Cellular Metal ◽  
Combined Use ◽  
Metal Quantification

THE SCANNING X-RAY MICROPROBE AT THE ESRF "X-RAY MICROSCOPY" BEAMLINE

2002 ◽  
Vol 09 (01) ◽  
pp. 203-211 ◽  
Author(s):  
J. SUSINI ◽  
M. SALOMÉ ◽  
B. FAYARD ◽  
R. ORTEGA ◽  
B. KAULICH
Keyword(s):  
Trace Elements ◽  
Fluorescence Microscopy ◽  
Phase Contrast ◽  
Materials Science ◽  
Fluorescence Yield ◽  
X Ray ◽  
Technical Developments ◽  
Contrast Method ◽  
Phase Contrast Method ◽  
Manufacturing Technologies

The development of high brilliance X-ray sources coupled with advances in manufacturing technologies of focusing optics has led to significant improvements in submicrometer probes for spectroscopy, diffraction and imaging applications. For instance, X-ray microscopy in the 1–10 keV energy range is better-suited for analyzing trace elements in fluorescence yield. This article will be biased towards submicron fluorescence microscopy developed on the ID21 beamline at the ESRF. The main technical developments, involving new focusing lenses or novel phase contrast method, are presented. Strengths and weaknesses of X-ray microscopy and spectromicroscopy techniques are discussed and illustrated by examples in biology, materials science and geology.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

Image Quality Analysis of X-ray Grating Interferometer Using Integrating-bucket Method

2020 ◽  
Vol 64 (2) ◽  
pp. 20503-1-20503-5
Author(s):  
Faiz Wali ◽  
Shenghao Wang ◽  
Ji Li ◽  
Jianheng Huang ◽  
Yaohu Lei ◽  
...  
Keyword(s):  
Image Quality ◽  
Phase Contrast ◽  
Quality Analysis ◽  
Phase Contrast Imaging ◽  
Phase Image ◽  
Contrast Imaging ◽  
High Quality ◽  
Image Quality Analysis ◽  
X Ray ◽  
Grating Interferometer

Abstract Grating-based x-ray phase-contrast imaging has the potential to enhance image quality and provide inner structure details non-destructively. In this work, using grating-based x-ray phase-contrast imaging system and employing integrating-bucket method, the quantitative expressions of signal-to-noise ratios due to photon statistics and mechanical error are analyzed in detail. Photon statistical noise and mechanical error are the main sources affecting the image noise in x-ray grating interferometry. Integrating-bucket method is a new phase extraction method translated to x-ray grating interferometry; hence, its image quality analysis would be of great importance to get high-quality phase image. The authors’ conclusions provide an alternate method to get high-quality refraction signal using grating interferometer, and hence increases applicability of grating interferometry in preclinical and clinical usage.

Numerical analysis of shift error in X-ray phase contrast imaging for large field of view

2017 ◽  
Vol 34 (1) ◽  
pp. 8
Author(s):  
Jianheng Huang ◽  
Yaohu Lei ◽  
Xin Liu ◽  
Jinchuan Guo ◽  
Ji Li ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
Phase Contrast ◽  
Field Of View ◽  
Phase Contrast Imaging ◽  
Large Field ◽  
Contrast Imaging ◽  
X Ray
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