Systematic errors in the determination of the spectroscopic g-factor in broadband ferromagnetic resonance spectroscopy: A proposed solution

2018 ◽  
Vol 123 (2) ◽  
pp. 023901 ◽  
Author(s):  
C. Gonzalez-Fuentes ◽  
R. K. Dumas ◽  
C. García
Keyword(s):  
Ferromagnetic Resonance ◽  
Systematic Errors ◽  
Resonance Spectroscopy ◽  
G Factor

scholarly journals Precise determination of the spectroscopic g-factor by use of broadband ferromagnetic resonance spectroscopy

2013 ◽  
Vol 114 (24) ◽  
pp. 243906 ◽  
Author(s):  
Justin M. Shaw ◽  
Hans T. Nembach ◽  
T. J. Silva ◽  
Carl T. Boone
Keyword(s):  
Ferromagnetic Resonance ◽  
Precise Determination ◽  
Resonance Spectroscopy ◽  
G Factor

scholarly journals Determination of the exchange constant ofTb0.3Dy0.7Fe2by broadband ferromagnetic resonance spectroscopy

2016 ◽  
Vol 93 (6) ◽  
Author(s):  
D. B. Gopman ◽  
J. W. Lau ◽  
K. P. Mohanchandra ◽  
K. Wetzlar ◽  
G. P. Carman
Keyword(s):  
Ferromagnetic Resonance ◽  
Exchange Constant ◽  
Resonance Spectroscopy

Bound electron g-factor measurement by double-resonance spectroscopy on a fine-structure transitionThis paper was presented at the International Conference on Precision Physics of Simple Atomic Systems, held at École de Physique, les Houches, France, 30 May  – 4 June, 2010.

2011 ◽  
Vol 89 (1) ◽  
pp. 79-84 ◽  
Author(s):  
David von Lindenfels ◽  
Nicolaas P.M. Brantjes ◽  
Gerhard Birkl ◽  
Wolfgang Quint ◽  
Vladimir M. Shabaev ◽  
...  
Keyword(s):  
Fine Structure ◽  
Penning Trap ◽  
Double Resonance ◽  
Structure Constant ◽  
Fine Structure Constant ◽  
Resonance Spectroscopy ◽  
Structure Transition ◽  
G Factor ◽  
Bound Electron

Precise determination of bound-electron g-factors in highly charged ions provides stringent tests for state of the art theoretical calculations. The scope reaches from relativistic electron-correlation effects on the one hand to bound-state QED terms on the other. Besides, the investigation can contribute to the determination of the fine-structure constant α. In a first approach with boron-like ions of spinless nuclei (e.g., 40Ar13+ and 40Ca15+), we will excite the 22P1/2 – 22P3/2 fine-structure transition with laser radiation and probe microwave transitions between Zeeman sublevels. From this laser-microwave double-resonance technique the g-factor can be determined on a ppb level of accuracy. We have prepared a cryogenic trap assembly with a creation trap and a spectroscopy trap — a half-open compensated cylindrical Penning trap. Argon gas will be injected through a remotely controlled valve, working at cryogenic temperature and in the field of a superconducting magnet. Ions are produced by electron impact ionization and transferred to the spectroscopy trap. In the future, the trap will be connected to the HITRAP facility at GSI, and the method will be applied to hyperfine-structure transitions of hydrogen-like heavy ions to measure electronic and nuclear magnetic moments. We present important techniques employed in the experiment.

Statistics and parallaxes

1978 ◽  
Vol 48 ◽  
pp. 7-29
Author(s):  
T. E. Lutz
Keyword(s):  
Experimental Design ◽  
Statistical Methods ◽  
Review Paper ◽  
Systematic Errors ◽  
Past Experience ◽  
Random Errors ◽  
Trigonometric Parallaxes ◽  
Systematic And Random Errors

This review paper deals with the use of statistical methods to evaluate systematic and random errors associated with trigonometric parallaxes. First, systematic errors which arise when using trigonometric parallaxes to calibrate luminosity systems are discussed. Next, determination of the external errors of parallax measurement are reviewed. Observatory corrections are discussed. Schilt’s point, that as the causes of these systematic differences between observatories are not known the computed corrections can not be applied appropriately, is emphasized. However, modern parallax work is sufficiently accurate that it is necessary to determine observatory corrections if full use is to be made of the potential precision of the data. To this end, it is suggested that a prior experimental design is required. Past experience has shown that accidental overlap of observing programs will not suffice to determine observatory corrections which are meaningful.

Systematic errors in equilibrium composition of ternary liquid-liquid systems and their effect on the calculated number of theoretical stages of countercurrent extraction

1988 ◽  
Vol 53 (6) ◽  
pp. 1172-1180
Author(s):  
Ján Dojčanský ◽  
Soňa Bafrncová ◽  
Július Surový
Keyword(s):  
Equilibrium Composition ◽  
Systematic Errors ◽  
Liquid Equilibrium ◽  
Countercurrent Extraction ◽  
Liquid Systems ◽  
Equilibrium Concentrations ◽  
Line Slope ◽  
Tie Line ◽  
Calculated Number

The influence of magnitude of systematic errors in the determination of ternary liquid-liquid equilibrium concentrations on the accuracy of the calculated number of theoretical stages of countercurrent extraction is evaluated on using five hypothetical systems differing in the extent of mutual solubility of components, tie-line slope, and type of binodal curve.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

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