scholarly journals Experimental characterization of the effects induced by passive plasma lens on high brightness electron bunches

2017 ◽  
Vol 111 (18) ◽  
pp. 184101 ◽  
Author(s):  
A. Marocchino ◽  
M. P. Anania ◽  
M. Bellaveglia ◽  
A. Biagioni ◽  
S. Bini ◽  
...  
Keyword(s):  
Experimental Characterization ◽  
High Brightness ◽  
Electron Bunches

Computational and experimental characterization of high-brightness beams for femtosecond electron imaging and spectroscopy

2013 ◽  
Vol 103 (25) ◽  
pp. 253115 ◽  
Author(s):  
J. Portman ◽  
H. Zhang ◽  
Z. Tao ◽  
K. Makino ◽  
M. Berz ◽  
...  
Keyword(s):  
Experimental Characterization ◽  
High Brightness ◽  
Imaging And Spectroscopy ◽  
Electron Imaging

scholarly journals A Versatile THz Source from High-Brightness Electron Beams: Generation and Characterization

2020 ◽  
Vol 5 (2) ◽  
pp. 40
Author(s):  
Enrica Chiadroni ◽  
Alessandro Cianchi ◽  
Massimo Ferrario ◽  
Andrea Mostacci ◽  
Riccardo Pompili ◽  
...  
Keyword(s):  
Peak Power ◽  
Pulse Shaping ◽  
Electron Beams ◽  
Test Facility ◽  
Thz Radiation ◽  
High Peak Power ◽  
Electromagnetic Spectrum ◽  
High Brightness ◽  
Electron Bunches

Ultra-short electron bunches, such as those delivered by a high-brightness photo-injector, are suitable to produce high peak power THz radiation, both broad and narrow band, with sub-picosecond down to femtosecond pulse shaping. The features of this kind of source in the THz range of the electromagnetic spectrum are extremely appealing for frequency- and time-domain experiments in a wide variety of fields. The present manuscript will overview the method of generation and characterization of THz radiation produced by high-brightness electron beams, as those available at the SPARC_LAB test facility.

Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees

2002 ◽  
Vol 716 ◽  
Author(s):  
C. L. Gan ◽  
C. V. Thompson ◽  
K. L. Pey ◽  
W. K. Choi ◽  
F. Wei ◽  
...  
Keyword(s):  
Stress Conditions ◽  
Experimental Characterization ◽  
Contact Lines ◽  
Tree Structures ◽  
Similar Test ◽  
Dual Damascene ◽  
Copper Interconnect ◽  
Test Conditions

AbstractElectromigration experiments have been carried out on simple Cu dual-damascene interconnect tree structures consisting of straight via-to-via (or contact-to-contact) lines with an extra via in the middle of the line. As with Al-based interconnects, the reliability of a segment in this tree strongly depends on the stress conditions of the connected segment. Beyond this, there are important differences in the results obtained under similar test conditions for Al-based and Cu-based interconnect trees. These differences are thought to be associated with variations in the architectural schemes of the two metallizations. The absence of a conducting electromigrationresistant overlayer in Cu technology, and the possibility of liner rupture at stressed vias lead to significant differences in tree reliabilities in Cu compared to Al.

Experimental Characterization of Mechanical Behavior of Cord-Rubber Composites

1982 ◽  
Vol 10 (1) ◽  
pp. 37-54 ◽  
Author(s):  
M. Kumar ◽  
C. W. Bert
Keyword(s):  
Response Characteristic ◽  
Cord Compression ◽  
Complete Characterization ◽  
Strain Response ◽  
Strain Gages ◽  
Experimental Characterization ◽  
Rubber Composites ◽  
Stress Strain ◽  
Strain Data

Abstract Unidirectional cord-rubber specimens in the form of tensile coupons and sandwich beams were used. Using specimens with the cords oriented at 0°, 45°, and 90° to the loading direction and appropriate data reduction, we were able to obtain complete characterization for the in-plane stress-strain response of single-ply, unidirectional cord-rubber composites. All strains were measured by means of liquid mercury strain gages, for which the nonlinear strain response characteristic was obtained by calibration. Stress-strain data were obtained for the cases of both cord tension and cord compression. Materials investigated were aramid-rubber, polyester-rubber, and steel-rubber.

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