Fringe order correction for the absolute phase recovered by two selected spatial frequency fringe projections in fringe projection profilometry

2017 ◽  
Vol 88 (8) ◽  
pp. 083104 ◽  
Author(s):  
Yi Ding ◽  
Kai Peng ◽  
Miao Yu ◽  
Lei Lu ◽  
Kun Zhao
Keyword(s):  
Spatial Frequency ◽  
Order Correction ◽  
Fringe Projection ◽  
Fringe Order ◽  
Absolute Phase ◽  
The Absolute ◽  
Fringe Projection Profilometry

Edge-preserved fringe-order correction strategy for code-based fringe projection profilometry

2021 ◽  
Vol 182 ◽  
pp. 107959
Author(s):  
Ji Deng ◽  
Jian Li ◽  
Hao Feng ◽  
Shumeng Ding ◽  
Yu Xiao ◽  
...  
Keyword(s):  
Order Correction ◽  
Fringe Projection ◽  
Fringe Order ◽  
Fringe Projection Profilometry

scholarly journals Absolute Phase Retrieval Using One Coded Pattern and Geometric Constraints of Fringe Projection System

2018 ◽  
Vol 8 (12) ◽  
pp. 2673 ◽  
Author(s):  
Xu Yang ◽  
Chunnian Zeng ◽  
Jie Luo ◽  
Yu Lei ◽  
Bo Tao ◽  
...  
Keyword(s):  
Phase Shift ◽  
Phase Retrieval ◽  
Code Word ◽  
Geometric Constraints ◽  
Fringe Projection ◽  
Average Intensity ◽  
Fringe Order ◽  
Projection System ◽  
Absolute Phase ◽  
Three Phase

Fringe projection technologies have been widely used for three-dimensional (3D) shape measurement. One of the critical issues is absolute phase recovery, especially for measuring multiple isolated objects. This paper proposes a method for absolute phase retrieval using only one coded pattern. A total of four patterns including one coded pattern and three phase-shift patterns are projected, captured, and processed. The wrapped phase, as well as average intensity and intensity modulation, are calculated from three phase-shift patterns. A code word encrypted into the coded pattern can be calculated using the average intensity and intensity modulation. Based on geometric constraints of fringe projection system, the minimum fringe order map can be created, upon which the fringe order can be calculated from the code word. Compared with the conventional method, the measurement depth range is significantly improved. Finally, the wrapped phase can be unwrapped for absolute phase map. Since only four patterns are required, the proposed method is suitable for real-time measurement. Simulations and experiments have been conducted, and their results have verified the proposed method.

scholarly journals High-resolution Three-dimensional Surface Imaging Microscope Based on Digital Fringe Projection Technique

2020 ◽  
Vol 20 (3) ◽  
pp. 139-144
Author(s):  
Cheng-Yang Liu ◽  
Tzu-Ping Yen ◽  
Chien-Wen Chen
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Three Dimensional ◽  
Fringe Projection ◽  
Surface Imaging ◽  
Projection Technique ◽  
Digital Fringe Projection ◽  
Absolute Phase ◽  
The Absolute ◽  
Fringe Patterns

AbstractThe three-dimensional (3-D) micro-scale surface imaging system based on the digital fringe projection technique for the assessments of microfiber and metric screw is presented in this paper. The proposed system comprises a digital light processing (DLP) projector, a set of optical lenses, a microscope, and a charge coupled device (CCD). The digital seven-step fringe patterns from the DLP projector pass through a set of optical lenses before being focused on the target surface. A set of optical lenses is designed for adjustment and size coupling of fringe patterns. A high-resolution CCD camera is employed to picture these distorted fringe patterns. The wrapped phase map is calculated by seven-step phase-shifting calculation from these distorted fringe patterns. The unwrapping calculation with quality guided path is introduced to compute the absolute phase values. The dimensional calibration methods are used to acquire the transformation between real 3-D shape and the absolute phase value. The capability of complex surface measurement for our system is demonstrated by using ISO standard screw M1.6. The experimental results for microfiber with 3 μm diameter indicate that the spatial and vertical resolutions can reach about 3 μm in our system. The proposed system provides a fast digital imaging system to examine the surface features with high-resolution for automatic optical inspection industry.

scholarly journals Absolute phase unwrapping with SVM for fringe-projection profilometry

2020 ◽  
Vol 14 (12) ◽  
pp. 2645-2651
Author(s):  
Sen Xiang ◽  
Huiping Deng ◽  
Jin Wu ◽  
Changjian Zhu
Keyword(s):  
Phase Unwrapping ◽  
Fringe Projection ◽  
Absolute Phase ◽  
Fringe Projection Profilometry
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