A flow cell for the study of gas-solid reactions via in situ powder X-ray diffraction

2017 ◽  
Vol 88 (10) ◽  
pp. 105104 ◽  
Author(s):  
Nicola V. Y. Scarlett ◽  
Damien Hewish ◽  
Rachel Pattel ◽  
Nathan A. S. Webster
Keyword(s):  
2011 ◽  
Vol 56 (3) ◽  
pp. 1546-1553 ◽  
Author(s):  
Jean-Pierre Veder ◽  
Ayman Nafady ◽  
Graeme Clarke ◽  
Ross P. Williams ◽  
Roland De Marco ◽  
...  

2015 ◽  
Vol 22 (2) ◽  
pp. 366-375 ◽  
Author(s):  
Marie Clancy ◽  
Mark J. Styles ◽  
Colleen J. Bettles ◽  
Nick Birbilis ◽  
Miao Chen ◽  
...  

This paper describes the quantitative measurement, byin situsynchrotron X-ray diffraction (S-XRD) and subsequent Rietveld-based quantitative phase analysis and thickness calculations, of the evolution of the PbO2and PbSO4surface layers formed on a pure lead anode under simulated copper electrowinning conditions in a 1.6 MH2SO4electrolyte at 318 K. This is the first report of a trulyin situS-XRD study of the surface layer evolution on a Pb substrate under cycles of galvanostatic and power interruption conditions, of key interest to the mining, solvent extraction and lead acid battery communities. The design of a novel reflection geometry electrochemical flow cell is also described. Thein situS-XRD results show that β-PbO2forms immediately on the anode under galvanostatic conditions, and undergoes continued growth until power interruption where it transforms to PbSO4. The kinetics of the β-PbO2to PbSO4conversion decrease as the number of cycles increases, whilst the amount of residual PbO2increases with the number of cycles due to incomplete conversion to PbSO4. Conversely, complete transformation of PbSO4to β-PbO2was observed in each cycle. The results of layer thickness calculations demonstrate a significant volume change upon PbSO4to β-PbO2transformation.


2002 ◽  
Vol 4 (3) ◽  
pp. 416-418 ◽  
Author(s):  
Michael J. Quayle ◽  
Roger J. Davey ◽  
Alistair J. McDermott ◽  
Gordon J. T. Tiddy ◽  
David T. Clarke ◽  
...  

Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


2017 ◽  
Vol 72 (6) ◽  
pp. 355-364
Author(s):  
A. Kopp ◽  
T. Bernthaler ◽  
D. Schmid ◽  
G. Ketzer-Raichle ◽  
G. Schneider

Sign in / Sign up

Export Citation Format

Share Document