Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials
2017 ◽
Vol 88
(10)
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pp. 103104
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2005 ◽
Vol 28
(1)
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pp. 121-127
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2012 ◽
Vol 24
(8)
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pp. 670-672
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