Electron microscopy with high accuracy and precision at atomic resolution: In-situ observation of a dielectric crystal under electric field

2017 ◽  
Vol 111 (6) ◽  
pp. 062904 ◽  
Author(s):  
Yukio Sato ◽  
Takashi Gondo ◽  
Hiroya Miyazaki ◽  
Ryo Teranishi ◽  
Kenji Kaneko
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
High Accuracy ◽  
Atomic Resolution ◽  
In Situ Observation ◽  
Dielectric Crystal ◽  
Accuracy And Precision

scholarly journals TEM sample preparation using micro-manipulator for in-situ MEMS experiment

2021 ◽  
Vol 51 (1) ◽  
Author(s):  
Hyunjong Lee ◽  
Odongo Francis Ngome Okello ◽  
Gi-Yeop Kim ◽  
Kyung Song ◽  
Si-Young Choi
Keyword(s):  
Electron Microscopy ◽  
Sample Preparation ◽  
Electrostatic Force ◽  
Single Step ◽  
Atomic Resolution ◽  
In Situ Observation ◽  
Micro Electro Mechanical Systems ◽  
Transmission Electron ◽  
Nano Wires

AbstractGrowing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggested the optical microscopy based micro-manipulating system for transferring TEM samples. By adopting our manipulator system, several types of samples from nano-wires to plate-like thin samples were transferred on micro-electro mechanical systems (MEMS) chip in a single step. Furthermore, the control of electrostatic force between the sample and the probe tip is found to be a key role in transferring process.

scholarly journals Cryo-EM model validation recommendations based on outcomes of the 2019 EMDataResource challenge

2021 ◽  
Vol 18 (2) ◽  
pp. 156-164 ◽  
Author(s):  
Catherine L. Lawson ◽  
Andriy Kryshtafovych ◽  
Paul D. Adams ◽  
Pavel V. Afonine ◽  
Matthew L. Baker ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structure Data ◽  
Model Evaluation ◽  
Data Bank ◽  
High Accuracy ◽  
Atomic Resolution ◽  
Software Developers ◽  
Data Archives ◽  
Modeling Software

AbstractThis paper describes outcomes of the 2019 Cryo-EM Model Challenge. The goals were to (1) assess the quality of models that can be produced from cryogenic electron microscopy (cryo-EM) maps using current modeling software, (2) evaluate reproducibility of modeling results from different software developers and users and (3) compare performance of current metrics used for model evaluation, particularly Fit-to-Map metrics, with focus on near-atomic resolution. Our findings demonstrate the relatively high accuracy and reproducibility of cryo-EM models derived by 13 participating teams from four benchmark maps, including three forming a resolution series (1.8 to 3.1 Å). The results permit specific recommendations to be made about validating near-atomic cryo-EM structures both in the context of individual experiments and structure data archives such as the Protein Data Bank. We recommend the adoption of multiple scoring parameters to provide full and objective annotation and assessment of the model, reflective of the observed cryo-EM map density.

scholarly journals Electron Microscopy Investigation of Magnetization Process in Thin Foils and Nanostructures

2007 ◽  
Vol 1026 ◽  
Author(s):  
Pascale Bayle-Guillemaud ◽  
Aurelien Masseboeuf ◽  
Fabien Cheynis ◽  
Jean-Christophe Toussaint ◽  
Olivier Fruchart ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Anisotropy ◽  
Magnetic Induction ◽  
Perpendicular Magnetic Anisotropy ◽  
In Situ Observation ◽  
Magnetic Imaging ◽  
Thin Foils ◽  
Transmission Electron

AbstractThis paper presents investigations of magnetization configuration evolution during in-situ magnetic processes in materials exhibiting planar and perpendicular magnetic anisotropy. Transmission electron microscopy has been used to perform magnetic imaging. Fresnel contrasts in Lorentz Transmission Electron Microscopy (LTEM) and phase retrieval methods such as Transport of Intensity Equation (TIE) solving or electron holography have been implemented. These techniques are sensitive to magnetic induction perpendicular to the electron beam and can give access to a spatially resolved (resolution better than 10 nm) mapping of magnetic induction distribution and could be extended to dynamical studies during in-situ observation. Thin foils of FePd alloys with a strong perpendicular magnetic anisotropy (PMA) and self-assembled Fe dots are presented. Both are studied during magnetization processes exhibiting the capacities of in-situ magnetic imaging in a TEM.

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

2008 ◽  
Vol 14 (S2) ◽  
pp. 436-437 ◽  
Author(s):  
G Yang ◽  
Y Zhao ◽  
K Sader ◽  
A Bleloch ◽  
RF Klie
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
New Mexico ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Resolution ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

scholarly journals Probing local order in multiferroics by transmission electron microscopy

2019 ◽  
Vol 5 (2) ◽  
Author(s):  
Marco Campanini ◽  
Rolf Erni ◽  
Marta D. Rossell
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Crystal Defects ◽  
Atomic Resolution ◽  
Magnetic Data ◽  
Local Order ◽  
Multiferroic Materials ◽  
New Device ◽  
Transmission Electron

Abstract The ongoing trend toward miniaturization has led to an increased interest in the magnetoelectric effect, which could yield entirely new device concepts, such as electric field-controlled magnetic data storage. As a result, much work is being devoted to developing new robust room temperature (RT) multiferroic materials that combine ferromagnetism and ferroelectricity. However, the development of new multiferroic devices has proved unexpectedly challenging. Thus, a better understanding of the properties of multiferroic thin films and the relation with their microstructure is required to help drive multiferroic devices toward technological application. This review covers in a concise manner advanced analytical imaging methods based on (scanning) transmission electron microscopy which can potentially be used to characterize complex multiferroic materials. It consists of a first broad introduction to the topic followed by a section describing the so-called phase-contrast methods, which can be used to map the polar and magnetic order in magnetoelectric multiferroics at different spatial length scales down to atomic resolution. Section 3 is devoted to electron nanodiffraction methods. These methods allow measuring local strains, identifying crystal defects and determining crystal structures, and thus offer important possibilities for the detailed structural characterization of multiferroics in the ultrathin regime or inserted in multilayers or superlattice architectures. Thereafter, in Section 4, methods are discussed which allow for analyzing local strain, whereas in Section 5 methods are addressed which allow for measuring local polarization effects on a length scale of individual unit cells. Here, it is shown that the ferroelectric polarization can be indirectly determined from the atomic displacements measured in atomic resolution images. Finally, a brief outlook is given on newly established methods to probe the behavior of ferroelectric and magnetic domains and nanostructures during in situ heating/electrical biasing experiments. These in situ methods are just about at the launch of becoming increasingly popular, particularly in the field of magnetoelectric multiferroics, and shall contribute significantly to understanding the relationship between the domain dynamics of multiferroics and the specific microstructure of the films providing important guidance to design new devices and to predict and mitigate failures.

Reactions in Metal-Metalloid Multilayers

1993 ◽  
Vol 311 ◽  
Author(s):  
Robert Sinclair ◽  
Toyohiko J. Konno
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Differential Scanning Calorimetry ◽  
Reactive Systems ◽  
Nucleation And Growth ◽  
In Situ Observation ◽  
Scanning Calorimetry ◽  
Compound Formation ◽  
Transmission Electron

ABSTRACTWe have studied the reactions at metal-metalloid interfaces using high resolution transmission electron microscopy, including in situ observation, and differential scanning calorimetry. There is contrasting behavior depending on the affinity for interaction or segregation. For reactive systems, compound formation ultimately results, but this can be preceded by solidstate amorphization. For non-reactive systems, crystallization of the metalloid is often achieved with nucleation and growth mediated by the metal phase.

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