scholarly journals Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy

AIP Advances ◽  
2017 ◽  
Vol 7 (5) ◽  
pp. 055118 ◽  
Author(s):  
Haomin Wang ◽  
Le Wang ◽  
Devon S. Jakob ◽  
Xiaoji G. Xu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Three Dimensional

Characterization of Overlapped Plasmon Modes in a Gold Hexagonal Plate Revealed by Three-Dimensional Near-Field Optical Microscopy

2019 ◽  
Vol 10 (4) ◽  
pp. 819-824 ◽  
Author(s):  
Takuya Matsuura ◽  
Keisuke Imaeda ◽  
Seiju Hasegawa ◽  
Hiromasa Suzuki ◽  
Kohei Imura
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Three Dimensional ◽  
Hexagonal Plate ◽  
Plasmon Modes

Simulation of Electromagnetic Field Distribution at a Nanowire Probe for Near Field Scanning Optical Microscopy

2008 ◽  
Author(s):  
Nathan P. Malcolm ◽  
Alex J. Heltzel ◽  
Li Shi ◽  
John R. Howell
Keyword(s):  
Optical Microscopy ◽  
Signal To Noise Ratio ◽  
Near Field ◽  
Three Dimensional ◽  
Field Enhancement ◽  
Fdtd Simulation ◽  
Plasmonic Nanoparticle ◽  
Excitation Laser ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

This work studies a new design of a near field scanning optical microscopy (NSOM) probe based on a ZnO nanowire sub-wavelength waveguide terminated with a plasmonic gold nanoparticle. Three-dimensional finite difference time domain (FDTD) simulation is used to visualize light guiding in the nanowire and near field coupling between the plasmonic nanoparticle and the substrate. The simulation results reveal local field enhancement at the gap between the nanoparticle and a gold substrate when the nanowire axis is tilted from the substrate normal by a small angle. The enhancement occurs only along the cross section plane that is parallel to the polarization of the excitation laser beam. The regime of field enhancement is much smaller than the diameter of the 100 nm plasmonic particle, making the nanowire probe well suited for NSOM with superior spatial resolution and signal to noise ratio compared to the state of the art.

scholarly journals In situ plant materials hyperspectral imaging by multimodal scattering near-field optical microscopy

2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Anne M. Charrier ◽  
Aubin C. Normand ◽  
Ali Passian ◽  
Philip Schaefer ◽  
Aude L. Lereu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Three Dimensional ◽  
Complete Removal ◽  
Plant Cell Walls ◽  
Environmental Chemical ◽  
Plant Materials ◽  
Complex Chemistry ◽  
20 Nm

AbstractPlant cells are elaborate three-dimensional polymer nano-constructs with complex chemistry. The bulk response of plants to light, in the far-field, is ultimately encoded by optical scattering from these nano-constructs. Their chemical and physical properties may be acquired through their interaction with a modulated nano-tip using scattering scanning near-field optical microscopy. Here, using this technique, we present 20 nm spatial resolution mechanical, spectral and optical mappings of plant cell walls. We first address the problem of plant polymers tracking through pretreatment and processing. Specifically, cellulose and lignin footprints are traced within a set of delignified specimen, establishing the factors hindering complete removal of lignin, an important industrial polymer. Furthermore, we determine the frequency dependent dielectric function $${\epsilon }(\omega)={(n+ik)}^{2}$$ ϵ ( ω ) = ( n + i k ) 2 of plant material in the range 28 ≤ ω ≤ 58 THz, and show how the environmental chemical variation is imprinted in the nanoscale variability of n and k. This nanometrology is a promise for further progress in the development of plant-based (meta-)materials.

scholarly journals Removing optical artifacts in near-field scanning optical microscopy by using a three-dimensional scanning mode

1999 ◽  
Vol 86 (5) ◽  
pp. 2785-2789 ◽  
Author(s):  
Claire E. Jordan ◽  
Stephan J. Stranick ◽  
Lee J. Richter ◽  
Richard R. Cavanagh
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Three Dimensional ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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