scholarly journals Improving temporal resolution of ultrafast electron diffraction by eliminating arrival time jitter induced by radiofrequency bunch compression cavities

2017 ◽  
Vol 4 (4) ◽  
pp. 044026 ◽  
Author(s):  
J. G. H. Franssen ◽  
O. J. Luiten
Keyword(s):  
Electron Diffraction ◽  
Temporal Resolution ◽  
Arrival Time ◽  
Ultrafast Electron Diffraction ◽  
Time Jitter ◽  
Bunch Compression

scholarly journals Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Victor Tkachenko ◽  
Vladimir Lipp ◽  
Martin Büscher ◽  
Flavio Capotondi ◽  
Hauke Höppner ◽  
...  
Keyword(s):  
Optical Properties ◽  
Temporal Resolution ◽  
Carrier Transport ◽  
Arrival Time ◽  
Auger Recombination ◽  
Optical Probe ◽  
Recent Measurement ◽  
High Temporal Resolution ◽  
Time Jitter ◽  
X Ray

AbstractSpatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. This, in an ideal case, would imply a similar resolution for the temporal pulse properties and the arrival time jitter between the FEL and optical laser pulses. However, carrier transport within the material and out of its surface, as well as carrier recombination may, in addition, significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. Below we analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si$${_3}$$ 3 N$$_4$$ 4 , on sub-picosecond timescales. Si$${_3}$$ 3 N$$_4$$ 4 is a wide-gap insulating material widely used for FEL pulse diagnostics. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement. The comparison indicates that three body Auger recombination strongly affects the optical response of Si$${_3}$$ 3 N$$_4$$ 4 after its collisional ionization stops. By deconvolving the contribution of Auger recombination, in future applications one could regain a high temporal resolution for the reconstruction of the FEL pulse properties measured with a Si$${_3}$$ 3 N$$_4$$ 4 -based diagnostics tool.

scholarly journals Ultrafast Optics: Sub‐10‐fs Timing for Ultrafast Electron Diffraction with THz‐Driven Streak Camera (Laser Photonics Rev. 15(2)/2021)

2021 ◽  
Vol 15 (2) ◽  
pp. 2170013
Author(s):  
Junho Shin ◽  
Hyun Woo Kim ◽  
In Hyung Baek ◽  
Sunjeong Park ◽  
Hyeon Sang Bark ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Streak Camera ◽  
Ultrafast Optics ◽  
Ultrafast Electron Diffraction

Compressed Ultrafast Electron Diffraction Imaging Through Electronic Encoding

2018 ◽  
Vol 10 (5) ◽  
Author(s):  
Dalong Qi ◽  
Chengshuai Yang ◽  
Fengyan Cao ◽  
Jinyang Liang ◽  
Yilin He ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Ultrafast Electron Diffraction ◽  
Diffraction Imaging
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