In-situ determination of the flat band carrier concentration and surface charge density of individual semiconductor nanowires by a combination of electrical and field emission measurements

2017 ◽  
Vol 121 (17) ◽  
pp. 174306 ◽  
Author(s):  
Yicong Chen ◽  
Xiaomeng Song ◽  
Zhibing Li ◽  
Shaozhi Deng ◽  
Juncong She ◽  
...  
ChemPhysChem ◽  
2020 ◽  
Vol 21 (13) ◽  
pp. 1474-1482 ◽  
Author(s):  
Steffan Møller Sønderskov ◽  
Lasse Hyldgaard Klausen ◽  
Sebastian Amland Skaanvik ◽  
Xiaojun Han ◽  
Mingdong Dong

Sign in / Sign up

Export Citation Format

Share Document