Enhanced accuracy of x-ray spectra reconstruction from filtered diode array measurements by adding a time integrated spectrometer

2017 ◽  
Vol 88 (4) ◽  
pp. 043507 ◽  
Author(s):  
Y. Ehrlich ◽  
S. Cohen ◽  
Y. Frank ◽  
A. Malka ◽  
G. Hurvitz ◽  
...  
Keyword(s):  
Diode Array ◽  
X Ray ◽  
Array Measurements

A combined sinusoidal transmission grating spectrometer and x-ray diode array diagnostics for time-resolved spectral measurements in laser plasma experiments

2019 ◽  
Vol 90 (1) ◽  
pp. 013501 ◽  
Author(s):  
Ze’ev Shpilman ◽  
Gilad Hurvitz ◽  
Liron Danon ◽  
Tomer Shussman ◽  
Yosi Ehrlich ◽  
...  
Keyword(s):  
Laser Plasma ◽  
Diode Array ◽  
Spectral Measurements ◽  
Time Resolved ◽  
X Ray ◽  
Transmission Grating ◽  
Grating Spectrometer

scholarly journals A genetic algorithm approach for reconstructing spectral content from filtered x-ray diode array spectrometers

2020 ◽  
Vol 91 (8) ◽  
pp. 083507 ◽  
Author(s):  
G. E. Kemp ◽  
M. S. Rubery ◽  
C. D. Harris ◽  
M. J. May ◽  
K. Widmann ◽  
...  
Keyword(s):  
Genetic Algorithm ◽  
Diode Array ◽  
Spectral Content ◽  
X Ray ◽  
Genetic Algorithm Approach

Measurement of central nickel density in Doublet III plasmas with a soft x‐ray diode array

1985 ◽  
Vol 57 (3) ◽  
pp. 806-815 ◽  
Author(s):  
R. J. Groebner ◽  
G. L. Jahns ◽  
S. Ejima ◽  
C. L. Hsieh
Keyword(s):  
Diode Array ◽  
X Ray

SU-F-BRE-06: Evaluation of Patient CT Dose Reconstruction From 3D Diode Array Measurements Using Anthropomorphic Phantoms

2014 ◽  
Vol 41 (6Part23) ◽  
pp. 392-392 ◽  
Author(s):  
M Huang ◽  
A Faught ◽  
S Benhabib ◽  
R Cardan ◽  
I Brezovich ◽  
...  
Keyword(s):  
Diode Array ◽  
Dose Reconstruction ◽  
Ct Dose ◽  
Array Measurements ◽  
Anthropomorphic Phantoms

scholarly journals XUV and Soft X-Ray Radiation from Laser Produced Plasmas as Laboratory Spectroscopic Sources

1984 ◽  
Vol 86 ◽  
pp. 212-212
Author(s):  
P. Gohil ◽  
M.L. Ginter ◽  
T.J. McIlrath ◽  
H. Kapoor ◽  
D. Ma ◽  
...  
Keyword(s):  
High Resolution ◽  
Laser Beam ◽  
Spectral Region ◽  
Focal Spot ◽  
Laser Energy ◽  
Diffraction Limit ◽  
High Resolution Spectroscopy ◽  
Diode Array ◽  
X Ray ◽  
Pin Photodiode

Laser produced plasmas have been shown to be excellent sources for applications in the XUV and soft X-ray spectral region. We are using a 550 mj, 25 ns (FWHM) ND:YAG laser operating at a repetition rate of 10 Hz to produce plasmas above rotatable solid targets. The focal spot of the laser beam with a 31 cm lens was measured to be 170 μm (approximately twice the diffraction limit), using a diode array having a 170 μm resolution. Broadband output in the soft X-ray region was studied using a windowless PIN photodiode with an A1203 surface covered with a polyethylene filter with transmission between 44 Å and 120 Å. Results are presented for the source’s soft X-ray intensity for several elements as a function of laser energy, focus and driving wavelength, as are preliminary results using the source for high resolution spectroscopy and for soft X-ray lithography.

Instantaneous Display of X-Ray Diffraction using a Diode Array Camera Tube

1968 ◽  
Vol 12 ◽  
pp. 165-173 ◽  
Author(s):  
Arthur N. Chester ◽  
Fred B. Koch
Keyword(s):  
Low Cost ◽  
High Sensitivity ◽  
Photon Flux ◽  
Diode Array ◽  
High Quantum Efficiency ◽  
X Ray ◽  
X Ray Imaging ◽  
Counting Statistics ◽  
Electron Imaging ◽  
Array Camera

AbstractThe silicon diode array camera tube, recently developed for PICTURFPHONE® service, was modified to permit X-ray imaging. High quantum efficiency is attained without the use of a phosphor screen, since each photon absorbed in the silicon target generates several hundred hole-electron pairs for each keV of its energy, most of which can he usefully collected. The sensitivity and resolution are adequate to allow a continuous television display of the diffracted intensity as a crystal is oriented. Particular advantages of this technique include; high resolution (< 25 μm); electronically variable magnification; direct oscilloscope measurement of X-ray spot Intensity profiles and relative spot intensities because signal current is directly proportional to photon flux; high sensitivity in the range of 0.6 to 5.0 Å, potentially limited only "by counting statistics; integration times variable from < 1/60 second to minutes; and expected low cost, since the camera tube has no complicated electron imaging, and is directly interchangeable Mith a standard television vidicon. Applications which are described include crystal orientation and X-ray topography.

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