Emission spectra of photoionized plasmas induced by intense EUV pulses: Experimental and theoretical investigations

2017 ◽  
Author(s):  
Ismail Saber ◽  
Andrzej Bartnik ◽  
Wojciech Skrzeczanowski ◽  
Przemysław Wachulak ◽  
Roman Jarocki ◽  
...  
2015 ◽  
Vol 33 (2) ◽  
pp. 193-200 ◽  
Author(s):  
A. Bartnik ◽  
H. Fiedorowicz ◽  
T. Fok ◽  
R. Jarocki ◽  
M. Szczurek ◽  
...  

AbstractIn this work, two laser-produced plasma (LPP) sources – extreme ultraviolet (EUV) and a LPP soft X-ray (SXR) source were used to create Ne photoionized plasmas. A radiation beam was focused onto a gas stream, injected into a vacuum chamber synchronously with the radiation pulse. EUV radiation spanned a wide spectral range with pronounced maximum centered at λ≈11 nm, while in case of the SXR source spectral maximum was at λ≈1.4 nm. Emission spectra of photoionized plasmas created this way were measured in a wide spectral range λ = 10–100 nm. The dominating spectral lines originated from singly charged ions (Ne II) and neutral atoms (Ne I). For the highest radiation fluence, spectral lines originating from Ne III and even Ne IV species were detected. Differences between the experimental spectra, obtained for all irradiation conditions, were analyzed. They were attributed either to different fluence or spectral distribution of driving photons.


Author(s):  
Y. Y. Wang ◽  
H. Zhang ◽  
V. P. Dravid ◽  
H. Zhang ◽  
L. D. Marks ◽  
...  

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.


1997 ◽  
Vol 7 (C2) ◽  
pp. C2-515-C2-516
Author(s):  
H. Agren ◽  
L. G.M. Pettersson ◽  
V. Carravetta ◽  
Y. Luo ◽  
L. Yang ◽  
...  

2005 ◽  
Vol 129 ◽  
pp. 85-90 ◽  
Author(s):  
K. Barczak ◽  
T. Pustelny ◽  
A. Szpakowski ◽  
M. Błahut

1980 ◽  
Vol 41 (12) ◽  
pp. 1431-1436 ◽  
Author(s):  
M. Larzillière ◽  
F. Launay ◽  
J.-Y. Roncin

1979 ◽  
Vol 40 (C2) ◽  
pp. C2-417-C2-419
Author(s):  
C. H.W. Jones ◽  
M. Dombsky
Keyword(s):  

1974 ◽  
Vol 35 (C6) ◽  
pp. C6-324-C6-324
Author(s):  
A. G. MADDOCK ◽  
A. F. WILLIAMS ◽  
J. FENGER ◽  
K. E. SIERKIERSKA
Keyword(s):  

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1059-C9-1062
Author(s):  
P. J. DURHAM ◽  
C. F. HAGUE ◽  
J.-M. MARIOT ◽  
W. M. TEMMERMAN

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