Theoretical modeling of electrical resistivity and Seebeck coefficient of bismuth nanowires by considering carrier mean free path limitation

2017 ◽  
Vol 121 (1) ◽  
pp. 014303 ◽  
Author(s):  
Masayuki Murata ◽  
Atsushi Yamamoto ◽  
Yasuhiro Hasegawa ◽  
Takashi Komine ◽  
Akira Endo
Keyword(s):  
Electrical Resistivity ◽  
Seebeck Coefficient ◽  
Free Path ◽  
Mean Free Path ◽  
Theoretical Modeling ◽  
Bismuth Nanowires

Enhancement of susceptibility and the electrical resistivity of organic metals with a small mean free path

Physica B+C ◽  
1984 ◽  
Vol 127 (1-3) ◽  
pp. 395-400 ◽  
Author(s):  
M. Weger ◽  
O. Entin-Wohlman ◽  
H. Gutfreund ◽  
M. Kaveh
Keyword(s):  
Electrical Resistivity ◽  
Free Path ◽  
Mean Free Path ◽  
Organic Metals

Thermoelectric properties for single crystal bismuth nanowires using a mean free path limitation model

2011 ◽  
Vol 110 (5) ◽  
pp. 053702 ◽  
Author(s):  
Daiki Nakamura ◽  
Masayuki Murata ◽  
Hiroya Yamamoto ◽  
Yasuhiro Hasegawa ◽  
Takashi Komine
Keyword(s):  
Single Crystal ◽  
Free Path ◽  
Thermoelectric Properties ◽  
Mean Free Path ◽  
Bismuth Nanowires

Enhancement of susceptibility and the electrical resistivity of organic metals with a small mean free path

1984 ◽  
Vol 50 (2) ◽  
pp. 251-263 ◽  
Author(s):  
O. Entin-wohlman ◽  
M. Kaveh ◽  
H. Gutfreund ◽  
M. Weger ◽  
N. F. Mott
Keyword(s):  
Electrical Resistivity ◽  
Free Path ◽  
Mean Free Path ◽  
Organic Metals

scholarly journals Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films

2012 ◽  
Vol 86 (4) ◽  
Author(s):  
Dooho Choi ◽  
Chang Soo Kim ◽  
Doron Naveh ◽  
Suk Chung ◽  
Andrew P. Warren ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Free Path ◽  
Mean Free Path ◽  
Electron Mean Free Path

Enhancement of susceptibility and the electrical resistivity of organic metals with a small mean free path

1984 ◽  
Vol 127 (1-3) ◽  
pp. 395-400 ◽  
Author(s):  
M WEGER ◽  
O ENTINWOHLMAN ◽  
H GUTFREUND ◽  
M KAVEH
Keyword(s):  
Electrical Resistivity ◽  
Free Path ◽  
Mean Free Path ◽  
Organic Metals

Influence of reduced mean free path on the electrical resistivity of Fe spin glass alloys

Physica B+C ◽  
1977 ◽  
Vol 86-88 ◽  
pp. 835-836 ◽  
Author(s):  
R. Buchmann ◽  
H.P. Falke ◽  
H.P. Jablonski ◽  
E.F. Wassermann
Keyword(s):  
Electrical Resistivity ◽  
Spin Glass ◽  
Free Path ◽  
Mean Free Path

Research on Seebeck Coefficient of Thin-Film Thermocouple on Temperature-Testing Cutter

2015 ◽  
Vol 757 ◽  
pp. 139-146 ◽  
Author(s):  
Yun Xian Cui ◽  
Yang An ◽  
Jia Hui Zhao ◽  
Xiao Xing Sheng
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Seebeck Coefficient ◽  
Thermoelectric Power ◽  
Free Path ◽  
Mean Free Path ◽  
Cutting Edge ◽  
Transient Temperature ◽  
Thin Film Thermocouple ◽  
Electron Mean Free Path

Performance of current temperature sensor is not satisfactory on monitoring transient temperature of cutting edge. A temperature-testing cutter is presented in this paper and analysis of Seebeck coefficient on thin film thermocouple is proposed with experiments. Thin film thermocouple is embedded into the cutting edge using magnetron sputtering technology. According to the fact that electrical conductivity can be replaced by the multiplication of electron mean free path λ and effective Fermi surface area A, a universal formula of thermoelectric power is given based on the diffuse thermoelectric power equation put forward by Mott and Jones. Using the expression of electron mean free path in gas model λ, the relationship of thermoelectric power between thin film and bulk material can be deduced. Result shows that the main influential factor of Seebeck coefficient is film thermal junction thickness. In addition, the Seebeck coefficient of different junction size and film thickness were tested by LabVIEW automatic calibration system. The experimental data indicates that Seebeck coefficient is determined by thermal junction thickness, and the sensor is found to be linear from room temperature up to 600°C while the Seebeck coefficient of thin film thermocouple becomes closer to standard thermocouple as the film thickness increments. However, junction size does not have a major influence on the Seebeck coefficient which is agreed by both theoretical analysis and test.

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