scholarly journals Comparison of device structures for the dielectric breakdown measurement of hexagonal boron nitride

2016 ◽  
Vol 109 (25) ◽  
pp. 253111 ◽  
Author(s):  
Yoshiaki Hattori ◽  
Takashi Taniguchi ◽  
Kenji Watanabe ◽  
Kosuke Nagashio
Keyword(s):  
Boron Nitride ◽  
Dielectric Breakdown ◽  
Hexagonal Boron Nitride ◽  
Device Structures

scholarly journals Layer-by-Layer Dielectric Breakdown of Hexagonal Boron Nitride

ACS Nano ◽  
2014 ◽  
Vol 9 (1) ◽  
pp. 916-921 ◽  
Author(s):  
Yoshiaki Hattori ◽  
Takashi Taniguchi ◽  
Kenji Watanabe ◽  
Kosuke Nagashio
Keyword(s):  
Boron Nitride ◽  
Dielectric Breakdown ◽  
Hexagonal Boron Nitride ◽  
Layer By Layer

scholarly journals Dielectric Breakdown in Chemical Vapor Deposited Hexagonal Boron Nitride

2017 ◽  
Vol 9 (45) ◽  
pp. 39758-39770 ◽  
Author(s):  
Lanlan Jiang ◽  
Yuanyuan Shi ◽  
Fei Hui ◽  
Kechao Tang ◽  
Qian Wu ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Dielectric Breakdown ◽  
Hexagonal Boron Nitride ◽  
Chemical Vapor ◽  
Chemical Vapor Deposited

Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride

2021 ◽  
Author(s):  
Alok Ranjan ◽  
Nagarajan Raghavan ◽  
Matthew Holwill ◽  
Kenji Watanabe ◽  
Takashi Taniguchi ◽  
...  
Keyword(s):  
Boron Nitride ◽  
Single Crystal ◽  
Dielectric Breakdown ◽  
Hexagonal Boron Nitride

Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride

2020 ◽  
Vol 12 (49) ◽  
pp. 55000-55010
Author(s):  
Alok Ranjan ◽  
Sean J. O’Shea ◽  
Michel Bosman ◽  
Nagarajan Raghavan ◽  
Kin Leong Pey
Keyword(s):  
Boron Nitride ◽  
Dielectric Breakdown ◽  
Hexagonal Boron Nitride

Marcus-Hush Theory Revealed by Electron Tunneling Through Hexagonal Boron Nitride

2019 ◽  
Author(s):  
Matěj Velický ◽  
Sheng Hu ◽  
Colin R. Woods ◽  
Peter S. Toth ◽  
Viktor Zólyomi ◽  
...  
Keyword(s):  
Electron Transfer ◽  
Boron Nitride ◽  
Electron Tunneling ◽  
Hexagonal Boron Nitride ◽  
Large Body ◽  
Liquid Solution ◽  
Limiting Current ◽  
Electron Transfer Rate Constant ◽  
Electrochemical Parameters ◽  
Voltammetric Measurements

Marcus-Hush theory of electron transfer is one of the pillars of modern electrochemistry with a large body of supporting experimental evidence presented to date. However, some predictions, such as the electrochemical behavior at microdisk electrodes, remain unverified. Herein, we present a study of electron tunneling across a hexagonal boron nitride barrier between a graphite electrode and redox levels in a liquid solution. This was achieved by the fabrication of microdisk electrodes with a typical diameter of 5 µm. Analysis of voltammetric measurements, using two common redox mediators, yielded several electrochemical parameters, including the electron transfer rate constant, limiting current, and transfer coefficient. They show a significant departure from the Butler-Volmer behavior in a clear manifestation of the Marcus-Hush theory of electron transfer. In addition, our system provides a novel experimental platform, which could be applied to address a number of scientific problems such as identification of reaction mechanisms, surface modification, or long-range electron transfer.

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