scholarly journals Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions

AIP Advances ◽  
2016 ◽  
Vol 6 (12) ◽  
pp. 125026
Author(s):  
J. K. Julin ◽  
S. Chaudhuri ◽  
M. Laitinen ◽  
T. Sajavaara ◽  
I. J. Maasilta
Keyword(s):  
Tunnel Junctions ◽  
Depth Profiling ◽  
Normal Metal ◽  
Superconducting Tunnel Junctions ◽  
Metal Insulator ◽  
Elemental Depth

Microrefrigeration by normal-metal/insulator/superconductor tunnel junctions

1997 ◽  
Vol 5 (7-12) ◽  
pp. 227-233 ◽  
Author(s):  
M.M. Leivo ◽  
A.J. Manninen ◽  
J.P. Pekola
Keyword(s):  
Tunnel Junctions ◽  
Normal Metal ◽  
Metal Insulator

Conductance in normal metal/insulator/ferromagnetic superconductor tunnel junctions

2003 ◽  
Vol 128 (8) ◽  
pp. 315-319 ◽  
Author(s):  
Xiaowei Li ◽  
R. Shen ◽  
D.Y. Xing
Keyword(s):  
Tunnel Junctions ◽  
Normal Metal ◽  
Metal Insulator

scholarly journals Andreev Reflections in Micrometer-Scale Normal Metal-Insulator-Superconductor Tunnel Junctions

2011 ◽  
Vol 167 (3-4) ◽  
pp. 392-397 ◽  
Author(s):  
Peter J. Lowell ◽  
Galen C. O’Neil ◽  
Jason M. Underwood ◽  
Joel N. Ullom
Keyword(s):  
Tunnel Junctions ◽  
Normal Metal ◽  
Metal Insulator ◽  
Micrometer Scale
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