Characterization of electrical noise limits in ultra-stable laser systems

2016 ◽  
Vol 87 (12) ◽  
pp. 123105 ◽  
Author(s):  
J. Zhang ◽  
X. H. Shi ◽  
X. Y. Zeng ◽  
X. L. Lü ◽  
K. Deng ◽  
...  
Keyword(s):  
Electrical Noise ◽  
Laser Systems ◽  
Stable Laser

Spatio-temporal characterization of double plasma mirror for ultrahigh contrast and stable laser pulse

2011 ◽  
Vol 104 (1) ◽  
pp. 81-86 ◽  
Author(s):  
IJ. Kim ◽  
I. W. Choi ◽  
S. K. Lee ◽  
K. A. Janulewicz ◽  
J. H. Sung ◽  
...  
Keyword(s):  
Laser Pulse ◽  
Spatio Temporal ◽  
Stable Laser

SLOW MANIFOLDS OF SOME CHAOTIC SYSTEMS WITH APPLICATIONS TO LASER SYSTEMS

2000 ◽  
Vol 10 (12) ◽  
pp. 2729-2744 ◽  
Author(s):  
SOFIANE RAMDANI ◽  
BRUNO ROSSETTO ◽  
LEON O. CHUA ◽  
RENÉ LOZI
Keyword(s):  
Negative Eigenvalue ◽  
Slow Manifold ◽  
Qualitative Description ◽  
Analytic Equation ◽  
Geometrical Characterization ◽  
Fast System ◽  
Laser Systems ◽  
The Lorenz System ◽  
Autonomous Dynamical Systems

In this work we deal with slow–fast autonomous dynamical systems. We initially define them as being modeled by systems of differential equations having a small parameter multiplying one of their velocity components. In order to analyze their solutions, some being chaotic, we have proposed a mathematical analytic method based on an iterative approach [Rossetto et al., 1998]. Under some conditions, this method allows us to give an analytic equation of the slow manifold. This equation is obtained by considering that the slow manifold is locally defined by a plane orthogonal to the tangent system's left fast eigenvector. In this paper, we give another method to compute the slow manifold equation by using the tangent system's slow eigenvectors. This method allows us to give a geometrical characterization of the attractor and a global qualitative description of its dynamics. The method used to compute the equation of the slow manifold has been extended to systems having a real and negative eigenvalue in a large domain of the phase space, as it is the case with the Lorenz system. Indeed, we give the Lorenz slow manifold equation and this allows us to make a qualitative study comparing this model and Chua's model. Finally, we apply our results to derive the slow manifold equations of a nonlinear optical slow–fast system, namely, the optical parametric oscillator model.

In situ characterization of laser diodes from wide-band electrical noise measurements

1986 ◽  
Vol 4 (7) ◽  
pp. 804-812 ◽  
Author(s):  
P. Andrekson ◽  
P. Andersson ◽  
A. Alping ◽  
S. Eng
Keyword(s):  
Laser Diodes ◽  
Wide Band ◽  
Electrical Noise ◽  
In Situ Characterization ◽  
Noise Measurements

scholarly journals Contribution of Different Noise Sources to the Relative Instability of Laser Systems Stabilized by External Silicon Cavities

Vestnik RFFI ◽  
2019 ◽  
Author(s):  
Denis S . Kryuchkov ◽  
Gulnara A. Vishnyakova ◽  
Ksenia Yu. Khabarova ◽  
Konstantin S. Kudeyarov ◽  
Nikita O. Zhadnov ◽  
...  
Keyword(s):  
Crystalline Silicon ◽  
High Vacuum ◽  
Frequency Instability ◽  
Ultra High Vacuum ◽  
Signal Frequency ◽  
Noise Sources ◽  
Fabry Perot ◽  
Laser Systems ◽  
Stable Laser ◽  
Frequency Counting

Here we consider creation of laser systems stabilized by external macroscopic monolithic Fabry – Perot cavities made of single-crystalline silicon operating at cryogenic temperatures. Fundamental thermal noise floor for fractional frequency instability was evaluated with its dependency on cavity’s spacer, mirror’s substrate and coatings material. Silicon cavities with dielectric SiO2 /Ta2 O5 and crystalline GaAs/InGaAs mirror coatings were created, its finesse at room temperatures was investigated. Two ultra-high vacuum optical cryostats were developed. Two ultra-stable laser systems based on cavities with dielectric mirrors were assembled. Comparison scheme via beat signal frequency counting was implemented for the characterization purpose. Different noise sources presenting at assembled systems are considered. Its impact to relative frequency instability of our laser systems is being explored.

ELECTRICAL NOISE CHARACTERIZATION OF N-TYPE-DOPED DISTRIBUTED BRAGG MIRRORS

2001 ◽  
Author(s):  
B. ORSAL ◽  
G. BELLEVILLE ◽  
P. SIGNORET ◽  
R. ALABEDRA ◽  
M. WINTREBERT-FOUQUET ◽  
...  
Keyword(s):  
Electrical Noise ◽  
Noise Characterization

Comparison of 1.5 μm Ultra-Stable Laser Systems Based on Fiber Noise Suppression System

2017 ◽  
Vol 44 (4) ◽  
pp. 0404001
Author(s):  
王朝阳 Wang Zhaoyang ◽  
金尚忠 Jin Shangzhong ◽  
李烨 Li Ye ◽  
林弋戈 Lin Yige ◽  
方占军 Fang Zhanjun
Keyword(s):  
Noise Suppression ◽  
Laser Systems ◽  
Stable Laser ◽  
Suppression System

scholarly journals Characterization of Stone Cleaning by Nd:YAG Lasers with Different Pulse Duration

2006 ◽  
Vol 2006 ◽  
pp. 1-6 ◽  
Author(s):  
Laura Bartoli ◽  
Paraskevi Pouli ◽  
Costas Fotakis ◽  
Salvatore Siano ◽  
Renzo Salimbeni
Keyword(s):  
Pulse Duration ◽  
Picosecond Laser ◽  
Ablation Rate ◽  
Stone Conservation ◽  
Nd:Yag Lasers ◽  
Simulated Sample ◽  
Laser Systems ◽  
First Time ◽  
Stone Artefact

The present work is a comparative study on the laser cleaning of stonework using Nd:YAG lasers at different pulse durations. The ablation rate, the degree of cleaning, and the appearance of the treated surface were studied irradiating a simulated sample and a real stone artefact using three different Nd:YAG laser systems with pulse duration of 90 microseconds, 15 nanoseconds, and 150 picoseconds. To our knowledge, the picosecond laser is here used for the first time in stone conservation. Differences in efficiency and in cleaning result are shown and discussed.

scholarly journals A variable probe pitch micro-Hall effect method

2018 ◽  
Vol 9 ◽  
pp. 2032-2039
Author(s):  
Maria-Louise Witthøft ◽  
Frederik W Østerberg ◽  
Janusz Bogdanowicz ◽  
Rong Lin ◽  
Henrik H Henrichsen ◽  
...  
Keyword(s):  
Standard Deviation ◽  
Hall Effect ◽  
Sheet Resistance ◽  
Carrier Mobility ◽  
Measurement Data ◽  
Electrical Noise ◽  
Electrode Position ◽  
Silicon Sample ◽  
Position Errors

Hall effect metrology is important for a detailed characterization of the electronic properties of new materials for nanoscale electronics. The micro-Hall effect (MHE) method, based on micro four-point probes, enables a fast characterization of ultrathin films with minimal sample preparation. Here, we study in detail how the analysis of raw measurement data affects the accuracy of extracted key sample parameters, i.e., how the standard deviation on sheet resistance, carrier mobility and Hall sheet carrier density is affected by the data analysis used. We compare two methods, based primarily on either the sheet resistance signals or the Hall resistance signals, by theoretically analysing the effects of electrode position errors and electrical noise on the standard deviations. We verify the findings with a set of experimental data measured on an ultrashallow junction silicon sample. We find that in presence of significant electrical noise, lower standard deviation is always obtained when the geometrical analysis is based on the sheet resistance signals. The situation is more complicated when electrode position errors are dominant; in that case, the better method depends on the experimental conditions, i.e., the distance between the insulating boundary and the electrodes. Improvement to the accuracy of Hall Effect measurement results is crucial for nanoscale metrology, since surface scattering often leads to low carrier mobility.

scholarly journals Cryogenic and large-base Fabry-Perot cavities for ultra-stable laser systems

2018 ◽  
Vol 190 ◽  
pp. 04011
Author(s):  
Denis S. Kryuchkov ◽  
N.O. Zhadnov ◽  
K.S. Kudeyarov ◽  
I.A. Semerikov ◽  
K.Yu. Khabarova ◽  
...  
Keyword(s):  
Fabry Perot ◽  
Laser Systems ◽  
Stable Laser
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