Microstructure and intrinsic stress evolution during epitaxial film growth of an Ag0.93Al0.07 solid solution on Si(111); excessive planar faulting due to quantum confinement
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2016 ◽
Vol 34
(4)
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pp. 041509
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2011 ◽
Vol 2011
(09)
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pp. P09018
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2009 ◽
Vol 55
(3(1))
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pp. 1132-1135
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