scholarly journals Microstructure and intrinsic stress evolution during epitaxial film growth of an Ag0.93Al0.07 solid solution on Si(111); excessive planar faulting due to quantum confinement

2016 ◽  
Vol 120 (15) ◽  
pp. 155305 ◽  
Author(s):  
D. Flötotto ◽  
Z. M. Wang ◽  
I. J. Markel ◽  
S. J. B. Kurz ◽  
E. J. Mittemeijer
2016 ◽  
Vol 34 (4) ◽  
pp. 041509 ◽  
Author(s):  
Daniel Edström ◽  
Davide G. Sangiovanni ◽  
Lars Hultman ◽  
Ivan Petrov ◽  
J. E. Greene ◽  
...  

2017 ◽  
Vol 122 (13) ◽  
pp. 135305 ◽  
Author(s):  
Yukio Nezu ◽  
Yu-Qiao Zhang ◽  
Chunlin Chen ◽  
Yuichi Ikuhara ◽  
Hiromichi Ohta

1999 ◽  
Vol 343-344 ◽  
pp. 500-503 ◽  
Author(s):  
J.S. Solomon ◽  
L. Petry ◽  
D.H. Tomich

Author(s):  
Kenji Sugiura ◽  
Hiromichi Ohta ◽  
Kenji Nomura ◽  
Hiroshi Yanagi ◽  
Masahiro Hirano ◽  
...  

Author(s):  
I FERGUSON ◽  
A THOMPSON ◽  
S BARNETT ◽  
F LONG ◽  
Z CHUANFENG

2009 ◽  
Vol 55 (3(1)) ◽  
pp. 1132-1135 ◽  
Author(s):  
Chung-Mo Yang ◽  
Seong-Kweon Kim

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