Low-temperature piezoresponse force microscopy on barium titanate

2016 ◽  
Vol 120 (8) ◽  
pp. 084103 ◽  
Author(s):  
Jonathan Döring ◽  
Lukas M. Eng ◽  
Susanne C. Kehr
Keyword(s):  
Barium Titanate ◽  
Low Temperature ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy

Low-temperature nanospectroscopy of the structural ferroelectric phases in single-crystalline barium titanate

Nanoscale ◽  
2018 ◽  
Vol 10 (37) ◽  
pp. 18074-18079 ◽  
Author(s):  
Jonathan Döring ◽  
Denny Lang ◽  
Lukas Wehmeier ◽  
Frederik Kuschewski ◽  
Tobias Nörenberg ◽  
...  
Keyword(s):  
Barium Titanate ◽  
Low Temperature ◽  
Domain Structure ◽  
Piezoresponse Force Microscopy ◽  
Single Crystalline ◽  
Force Microscopy

Revealing the domain structure of (111)-oriented BaTiO3 by nanospectroscopy and piezoresponse force microscopy in all ferroelectric phases down to 150 K.

scholarly journals Polarization Domain Dynamics of Barium Titanate Ultrathin Films Using Piezoresponse Force Microscopy.

2021 ◽  
Author(s):  
gregory salamo ◽  
Mohammad Zamani-Alavijeh ◽  
Timothy Morgan ◽  
Andrian Kuchuk
Keyword(s):  
Thin Films ◽  
Barium Titanate ◽  
Domain Wall ◽  
Electric Field ◽  
Piezoresponse Force Microscopy ◽  
Material Constants ◽  
Force Microscopy ◽  
Atomic Force ◽  
Domain Dynamics ◽  
Limiting Velocity

Abstract Piezoresponse force microscopy is used to study the velocity of the polarization domain wall in ultrathin ferroelectric barium titanate films grown on strontium titanate substrates by molecular beam epitaxy. The electric field due to the cone of the atomic force microscope tip is proposed as the dominant electric field of the tip in thin films for domain expansion at lateral distances greater than about one tip diameter away from the tip. The velocity of the domain wall under the applied electric field by the tip in barium titanate for thin films (less than 40 nm) followed an expanding process given by Merz’s law. The material constants in a fit of the data to Merz’s law for very thin films are reported as about 4.2 KV/cm for activation field, Ea, and 0.05 nm/s for limiting velocity, v∞. These material constants showed a dependence on the level of strain in the films but no fundamental dependence on thickness.

Low-temperature evolution of local polarization properties of PbZr0.65Ti0.35O3 thin films probed by piezoresponse force microscopy

2014 ◽  
Vol 104 (11) ◽  
pp. 112905 ◽  
Author(s):  
N. V. Andreeva ◽  
M. Tyunina ◽  
A. V. Filimonov ◽  
A. I. Rudskoy ◽  
N. A. Pertsev ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Piezoresponse Force Microscopy ◽  
Temperature Evolution ◽  
Force Microscopy ◽  
Local Polarization

In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”

2021 ◽  
Vol 543 ◽  
pp. 148808
Author(s):  
D.O. Alikin ◽  
L.V. Gimadeeva ◽  
A.V. Ankudinov ◽  
Q. Hu ◽  
V.Ya. Shur ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Polarization Contribution
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