The effect of losses on the quantum-noise cancellation in the SU(1,1) interferometer

2016 ◽  
Vol 109 (5) ◽  
pp. 051107 ◽  
Author(s):  
Jun Xin ◽  
Hailong Wang ◽  
Jietai Jing
Keyword(s):  
Quantum Noise ◽  
Noise Cancellation

scholarly journals Quantum noise cancellation in asymmetric speed metres with balanced homodyne readout

2018 ◽  
Vol 20 (10) ◽  
pp. 103040 ◽  
Author(s):  
T Zhang ◽  
E Knyazev ◽  
S Steinlechner ◽  
F Ya Khalili ◽  
B W Barr ◽  
...  
Keyword(s):  
Quantum Noise ◽  
Noise Cancellation

scholarly journals All-mechanical quantum noise cancellation for accelerometry: broadband with momentum measurements, narrow band without

2016 ◽  
Vol 18 (3) ◽  
pp. 034002 ◽  
Author(s):  
Kurt Jacobs ◽  
Nikolas Tezak ◽  
Hideo Mabuchi ◽  
Radhakrishnan Balu
Keyword(s):  
Quantum Noise ◽  
Narrow Band ◽  
Noise Cancellation

scholarly journals Atom-based coherent quantum-noise cancellation in optomechanics

2015 ◽  
Vol 92 (4) ◽  
Author(s):  
F. Bariani ◽  
H. Seok ◽  
S. Singh ◽  
M. Vengalattore ◽  
P. Meystre
Keyword(s):  
Quantum Noise ◽  
Noise Cancellation ◽  
Coherent Quantum

scholarly journals Optimal quantum noise cancellation with an entangled witness channel

2021 ◽  
Vol 3 (4) ◽  
Author(s):  
Daniel W. Gould ◽  
Min Jet Yap ◽  
Vaishali B. Adya ◽  
Bram J. J. Slagmolen ◽  
Robert L. Ward ◽  
...  
Keyword(s):  
Quantum Noise ◽  
Noise Cancellation

Enhancing optomechanical force sensing via precooling and quantum noise cancellation

2019 ◽  
Vol 63 (1) ◽  
Author(s):  
Tesfay Gebremariam ◽  
Ye-Xiong Zeng ◽  
Mojtaba Mazaheri ◽  
Chong Li
Keyword(s):  
Quantum Noise ◽  
Noise Cancellation ◽  
Force Sensing

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

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