Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method
1987 ◽
Vol 26
(Part 2, No. 9)
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pp. L1555-L1557
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Keyword(s):
2009 ◽
Vol 65
(6)
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pp. i44-i44
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2007 ◽
Vol 40
(4)
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pp. 710-715
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1998 ◽
Vol 137
(2)
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pp. 359-364
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2006 ◽
Vol 62
(5)
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pp. i112-i113
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