Kirkwood correlation factor of neopentanol – carbon tetrachloride solution

2016 ◽  
Author(s):  
Girish Chandra
Keyword(s):  
Carbon Tetrachloride ◽  
Correlation Factor ◽  
Kirkwood Correlation Factor ◽  
Carbon Tetrachloride Solution

The Photo‐Chlorination of Methyl Chloroformate in Carbon Tetrachloride Solution

1949 ◽  
Vol 17 (6) ◽  
pp. 566-573 ◽  
Author(s):  
T. L. Batke ◽  
L. M. Dorfman ◽  
D. J. LeRoy
Keyword(s):  
Carbon Tetrachloride ◽  
Carbon Tetrachloride Solution

scholarly journals Configurational Statistics

1978 ◽  
Vol 21 (85) ◽  
pp. 73-83 ◽  
Author(s):  
J. F. Nagle
Keyword(s):  
Dielectric Constant ◽  
Long Range ◽  
Short Range ◽  
Theoretical Calculations ◽  
Correlation Factor ◽  
Residual Entropy ◽  
Dipolar Interactions ◽  
Computational Tool ◽  
Kirkwood Correlation Factor ◽  
Polarization Factor

Abstract Theories of the dielectric constant in ice differ in three fundamentally different ways that are often confused with each other. First, there is the choice of interactions to include in the model, notably whether to try to include long-range dipolar interactions as in the Kirkwood theory or to include only the short-range ice-rule interactions. Second, there is the choice of the kind of statistical quantity calculated, e.g. the Kirkwood correlation factor g or the polarization factor G, which Stillinger and Cotter showed to be different. Finally, there is the choice of the kind of computational tool used, and in original papers this choice often obscures the first two differences. With these distinctions in mind a review is given of current theoretical calculations of the dielectric constant and the residual entropy and how the different theories relate to each other and to experiments.

Synthesis of Silicon Carbide Films from Partially Oxidized Polyvinylsilane by Carbon Tetrachloride Solution Casting

2002 ◽  
Vol 17 (1) ◽  
pp. 214-223 ◽  
Author(s):  
Masaki Narisawa ◽  
Takeshi Hasegawa ◽  
Kiyohito Okamura ◽  
Masayoshi Itoh ◽  
Thomas Apple ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Carbon Tetrachloride ◽  
Radical Polymerization ◽  
Air Flow ◽  
Spectroscopic Studies ◽  
Flow Time ◽  
Silica Layer ◽  
Solution Casting ◽  
Amorphous Films ◽  
Carbon Tetrachloride Solution

Polyvinylsilane (PVS), derived from vinylsilane by radical polymerization, was partially oxidized in hot carbon tetrachloride solution by flowing air. If the air flow time is adjusted, soft gel films can be formed in a Teflon dish by casting the PVS solution. After the PVS films were peeled from the substrates, they were pyrolyzed at various temperatures. Spectroscopic studies of the pyrolyzed films up to 1273 K suggested that carbosilane (Si–CH2–Si) structures are formed in the films at 473–673 K. The compositions of the amorphous films obtained at 1673 K were approximately SiC1.38O0.21 and SiC1.41O0.51, depending on the crosslinking conditions. The oxygen incorporated in the films was removed in the form of CO and SiO during further heating at 1673–1873 K. The compositions of the films were changed to approximately SiC1.25 and SiC1.26, respectively, at 2073 K. The films obtained at 1273 K did not show degradation during the oxidation at 1273–1673 K while a protective silica layer was formed on their surfaces.

MICRODETERMINATION OF COBALT COLORIMETRICALLY AS THE 1-NITROSO-2-NAPHTHOL COMPLEX

1953 ◽  
Vol 31 (2) ◽  
pp. 145-149 ◽  
Author(s):  
W. E. Nichol
Keyword(s):  
Carbon Tetrachloride ◽  
Cobalt Complex ◽  
Visible Spectrum ◽  
Maximum Absorption ◽  
Order Of Accuracy ◽  
Carbon Tetrachloride Solution ◽  
Iron Interference

An advantage of determining cobalt with 1-nitroso-2-naphthol is that the reagent is relatively stable and forms a very stable cobalt complex. Also this cobalt complex has maximum absorption in the visible spectrum which allows determination visually or with ordinary colorimeters.The procedure is based on decreasing the iron interference by the removal of part of the iron as phosphate and on a simple purification of the carbon tetrachloride solution of the 1-nitroso-2-naphthol cobalt complex which eliminates traces of palladium, iron, etc.The method has the same order of accuracy as the o-nitrosocresol method but preparation of reagents and the analysis in general require less time.

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