Dielectric constant extraction of graphene nanostructured on SiC substrates from spectroscopy ellipsometry measurement using Gauss–Newton inversion method
2020 ◽
Vol 25
(2)
◽
pp. 287-292
Keyword(s):
2009 ◽
Vol 6
(1)
◽
pp. 207-241
◽
Keyword(s):
1989 ◽
Vol 47
◽
pp. 180-181
Keyword(s):