scholarly journals Nanoscale surface charge detection in epoxy resin materials using electrostatic force spectroscopy

AIP Advances ◽  
2016 ◽  
Vol 6 (3) ◽  
pp. 035318 ◽  
Author(s):  
D. El Khoury ◽  
R. Arinero ◽  
J. C. Laurentie ◽  
J. Castellon
Keyword(s):  
Surface Charge ◽  
Epoxy Resin ◽  
Electrostatic Force ◽  
Force Spectroscopy ◽  
Charge Detection

Surface charge detection probe

Norchip 2007 ◽  
2007 ◽  
Author(s):  
Olli Kursu ◽  
Janne Kivijakola ◽  
Marko Pudas ◽  
Timo Rahkonen
Keyword(s):  
Surface Charge ◽  
Charge Detection ◽  
Detection Probe

scholarly journals Mechano-Triboelectric Analysis of Surface Charge Generation on Replica-Molded Elastomeric Nanodomes

Micromachines ◽  
2021 ◽  
Vol 12 (12) ◽  
pp. 1460
Author(s):  
Myung Gi Ji ◽  
Mohammed Bazroun ◽  
In Ho Cho ◽  
W. Dennis Slafer ◽  
Rana Biswas ◽  
...  
Keyword(s):  
Charge Density ◽  
Surface Charge ◽  
Electrostatic Force ◽  
High Surface ◽  
Interfacial Friction ◽  
Generation Process ◽  
Charge Generation ◽  
Replica Molding ◽  
Force Microscopy ◽  
Triboelectric Charging

Replica molding-based triboelectrification has emerged as a new and facile technique to generate nanopatterned tribocharge on elastomer surfaces. The “mechano-triboelectric charging model” has been developed to explain the mechanism of the charge formation and patterning process. However, this model has not been validated to cover the full variety of nanotexture shapes. Moreover, the experimental estimation of the tribocharge’s surface density is still challenging due to the thick and insulating nature of the elastomeric substrate. In this work, we perform experiments in combination with numerical analysis to complete the mechano-triboelectrification charging model. By utilizing Kelvin probe force microscopy (KPFM) and finite element analysis, we reveal that the mechano-triboelectric charging model works for replica molding of both recessed and protruding nanotextures. In addition, by combining KPFM with numerical electrostatic modeling, we improve the accuracy of the surface charge density estimation and cross-calibrate the result against that of electrostatic force microscopy. Overall, the regions which underwent strong interfacial friction during the replica molding exhibited high surface potential and charge density, while those suffering from weak interfacial friction exhibited low values on both. These multi-physical approaches provide useful and important tools for comprehensive analysis of triboelectrification and generation of nanopatterned tribocharge. The results will widen our fundamental understanding of nanoscale triboelectricity and advance the nanopatterned charge generation process for future applications.

scholarly journals Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

2018 ◽  
Vol 9 ◽  
pp. 1146-1155 ◽  
Author(s):  
Yue Shen ◽  
Ying Wang ◽  
Yuan Zhou ◽  
Chunxi Hai ◽  
Jun Hu ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Graphene Oxide ◽  
Electrostatic Force ◽  
Force Spectroscopy ◽  
Restricted Area ◽  
Degree Of Reduction ◽  
Force Microscopy ◽  
Reducing Conditions ◽  
Direct Current Bias ◽  
Reduced Graphene

Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric constant difference of graphene oxide (GO) sheets (reduced using various methods), EFS can be used to characterize the degree of reduction of uniformly reduced one-atom-thick GO sheets at the nanoscale. In this paper, using thermally or chemically reduced individual GO sheets on mica substrates as examples, we characterize their degree of reduction at the nanoscale using EFS. For the reduced graphene oxide (rGO) sheets with a given degree of reduction (sample n), the EFS curve is very close to a parabola within a restricted area. We found that the change in parabola opening direction (or sign the parabola opening value) indicates the onset of reduction on GO sheets. Moreover, the parabola opening value, the peak bias value (tip bias leads to the peak or valley EFM phases) and the EFM phase contrast at a certain tip bias less than the peak value can all indicate the degree of reduction of rGO samples, which is positively correlated with the dielectric constant. In addition, we gave the ranking of degree for reduction on thermally or chemically reduced GO sheets and evaluated the effects of the reducing conditions. The identification of the degree of reduction of GO sheets using EFS is important for reduction strategy optimization and mass application of GO, which is highly desired owing to its mechanical, thermal, optical and electronic applications. Furthermore, as a general and quantitative technique for evaluating the small differences in the dielectric properties of nanomaterials, the EFS technique will extend and facilitate its nanoscale electronic devices applications in the future.

Surface charge decay of epoxy resin treated by AP-DBD deposition and direct fluorination

2019 ◽  
Vol 26 (3) ◽  
pp. 768-775
Author(s):  
Cheng Zhang ◽  
Yiyang Ma ◽  
Fei Kong ◽  
Ruixue Wang ◽  
Chengyan Ren ◽  
...  
Keyword(s):  
Surface Charge ◽  
Epoxy Resin ◽  
Direct Fluorination ◽  
Charge Decay

scholarly journals Molecular Structure Modulated Trap Distribution and Carrier Migration in Fluorinated Epoxy Resin

Molecules ◽  
2020 ◽  
Vol 25 (13) ◽  
pp. 3071 ◽  
Author(s):  
Jin Li ◽  
Yufan Wang ◽  
Zhaoyu Ran ◽  
Hang Yao ◽  
Boxue Du ◽  
...  
Keyword(s):  
Molecular Structure ◽  
Surface Charge ◽  
Epoxy Resin ◽  
Mobility Model ◽  
Molecular Orbitals ◽  
Chemical Calculation ◽  
Dissipation Process ◽  
Highest Occupied Molecular Orbitals ◽  
Lowest Unoccupied Molecular Orbitals ◽  
Positively Charged

Surface charge accumulation on epoxy insulators is one of the most serious problems threatening the operation safety of the direct current gas-insulated transmission line (GIL), and can be efficiently inhibited by the surface modification technology. This paper investigated the mechanisms of fluorination modulated surface charge behaviors of epoxy resin through quantum chemical calculation (QCC) analysis of the molecular structure. The results show that after fluorination, the surface charge dissipation process of the epoxy sample is accelerated by the introduced shallow trap sites, which is further clarified by the carrier mobility model. The electron distribution probability of the highest occupied molecular orbitals (HOMO) under positive charging and the lowest unoccupied molecular orbitals (LUMO) under negative charging shows distinctive patterns. It is illustrated that electrons are likely to aggregate locally around benzenes for the positively charged molecular structure, while electrons tend to distribute all along the epoxy chain under negatively charging. The calculated results verify that fluorination can modulate surface charge behaviors of epoxy resin through redesigning its molecular structure, trap distribution and charging patterns.

Effects of nanosecond pulse voltage parameters on characteristics of surface charge for epoxy resin

2018 ◽  
Vol 25 (6) ◽  
pp. 2058-2066 ◽  
Author(s):  
Fei Kong ◽  
Shuai Zhang ◽  
Haofan Lin ◽  
Chengyan Ren ◽  
Cheng Zhang ◽  
...  
Keyword(s):  
Surface Charge ◽  
Epoxy Resin ◽  
Nanosecond Pulse ◽  
Pulse Voltage
Sign in / Sign up

Export Citation Format

Share Document