High-frequency electromagnetic properties of soft magnetic Nd2Co17 micron flakes fractured along c crystal plane with natural resonance frequency exceeding 10 GHz

2016 ◽  
Vol 108 (9) ◽  
pp. 092406 ◽  
Author(s):  
Yongbo Zhang ◽  
Peng Wang ◽  
Tianyong Ma ◽  
Ying Wang ◽  
Liang Qiao ◽  
...  
Keyword(s):  
Resonance Frequency ◽  
High Frequency ◽  
Crystal Plane ◽  
Electromagnetic Properties ◽  
Soft Magnetic ◽  
Natural Resonance ◽  
Natural Resonance Frequency

A Review of Recent Developments in Atomic Force Microscopy Systems With Application to Manufacturing and Biological Processes

2003 ◽  
Author(s):  
Karthik Laxminarayana ◽  
Nader Jalili
Keyword(s):  
Resonance Frequency ◽  
Intermolecular Forces ◽  
Minimal Amount ◽  
Contact Mode ◽  
Tapping Mode ◽  
Atomic Force ◽  
Natural Resonance ◽  
Target Sample ◽  
Recent Developments ◽  
Natural Resonance Frequency

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of microstructural parameters and intermolecular forces at nanoscale level with atomic-resolution characterization. Typically, these microcantilever systems are operated in three open-loop modes; non-contact mode, contact mode, and tapping mode. In order to probe electric, magnetic, and/or atomic forces of a selected sample, the non-contact mode is utilized by moving the cantilever slightly away from the sample surface and oscillating the cantilever at or near its natural resonance frequency. Alternatively, the contact mode acquires sample attributes by monitoring interaction forces while the cantilever tip remains in contact with the target sample. The tapping mode of operation combines qualities of both the contact and non-contact modes by gleaning sample data and oscillating the cantilever tip at or near its natural resonance frequency while allowing the cantilever tip to impact the target sample for a minimal amount of time. Recent research on AFM systems has focused on many fabrication and manufacturing processes at molecular levels due to its tremendous surface microscopic capabilities. This paper provides a review of such recent developments in AFM imaging systems with emphasis on operational modes, microcantilever dynamic modeling and control. Due to the important contributions of AFM systems to manufacturing, this paper also provides a comprehensive review of recent applications of different AFM systems in these important areas.

Spin sprayed Ni(–Zn)–Co ferrite films with natural resonance frequency exceeding 3GHz

2007 ◽  
Vol 101 (9) ◽  
pp. 09M502 ◽  
Author(s):  
Koichi Kondo ◽  
Shigeyoshi Yoshida ◽  
Hiroshi Ono ◽  
Masanori Abe
Keyword(s):  
Resonance Frequency ◽  
Natural Resonance ◽  
Ferrite Films ◽  
Natural Resonance Frequency

High-frequency electromagnetic properties of soft magnetic Y2Fe17Nx particles with easy-plane anisotropy

2015 ◽  
Vol 477 ◽  
pp. 52-55 ◽  
Author(s):  
Guoguo Tan ◽  
Yongbo Zhang ◽  
Liang Qiao ◽  
Tao Wang ◽  
Jianbo Wang ◽  
...  
Keyword(s):  
High Frequency ◽  
Easy Plane ◽  
Electromagnetic Properties ◽  
Soft Magnetic ◽  
Plane Anisotropy

High-Frequency Performance of Co2FeAl Half-Metallic Films Prepared by Oblique Sputtering under Various Deposition Conditions

2014 ◽  
Vol 787 ◽  
pp. 368-372 ◽  
Author(s):  
Zhi Yi Cai ◽  
Shan Dong Li ◽  
Xiao Qin Cao ◽  
Hong Lei Du ◽  
Qian Xue ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Resonance Frequency ◽  
Ferromagnetic Resonance ◽  
High Frequency ◽  
Metallic Films ◽  
Soft Magnetic ◽  
Half Metallic ◽  
Self Bias ◽  
Ferromagnetic Resonance Frequency ◽  
High Frequency Performance

Co2FeAl full-Hesuler alloys show good soft magnetic properties, implying a promising high ferromagnetic resonance frequency. In this study, Co2FeAl films were deposited on Si (100) substrates using an oblique sputtering method. As expected, a good high-frequency performance was achieved in the as-deposited Co2FeAl films without any annealing. An obvious uniaxial magnetic anisotropy over 200 Oe with the magnetic hard axis along the radial direction of the sample turntable was obtained. As a result, the self-bias ferromagnetic resonance frequency reaches more than 4 GHz for the Co2FeAl films prepared under an integrated circuits compatible process. These results indicate that the Co2FeAl films are promising in integrated circuits RF/microwave devices.

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