scholarly journals Tunability, dielectric, and piezoelectric properties of Ba(1−x)CaxTi(1−y)ZryO3 ferroelectric thin films

2016 ◽  
Vol 119 (9) ◽  
pp. 094107 ◽  
Author(s):  
C. J. M. Daumont ◽  
Q. Simon ◽  
E. Le Mouellic ◽  
S. Payan ◽  
P. Gardes ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Ferroelectric Thin Films ◽  
Dielectric And Piezoelectric Properties

Grain Size Effect on Dielectric and Piezoelectric Properties of Alkoxy-Derived BaTiO3-Based Thin Films

2004 ◽  
Vol 43 (9B) ◽  
pp. 6525-6529 ◽  
Author(s):  
Kiyotaka Tanaka ◽  
Kazuyuki Suzuki ◽  
Desheng Fu ◽  
Kaori Nishizawa ◽  
Takeshi Miki ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Size Effect ◽  
Piezoelectric Properties ◽  
Grain Size Effect ◽  
Dielectric And Piezoelectric Properties

Dielectric and piezoelectric properties of very thin films of VDF-TrFE copolymers

1990 ◽  
Vol 109 (1) ◽  
pp. 309-314 ◽  
Author(s):  
J. Glatz-Reichenbach ◽  
Li-Jie ◽  
D. Schilling ◽  
E. Schreck ◽  
K. Dransfeld
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Dielectric And Piezoelectric Properties

Influence of the processing parameters on the piezoelectric properties of sputtered lead-based ferroelectric thin films

1997 ◽  
Vol 17 (1-4) ◽  
pp. 329-338
Author(s):  
B. Jaber ◽  
G. Velu ◽  
E. Cattan ◽  
P. Tronc ◽  
D. Remiens ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Processing Parameters ◽  
Ferroelectric Thin Films

Dielectric and Piezoelectric Properties of Pb(Zr 0.53 Ti 0.47 )O 3 -Pb(Mg 1/3 Nb 2/3 )O 3 Multi-Layer Thin Films

2002 ◽  
Vol 270 (1) ◽  
pp. 185-190 ◽  
Author(s):  
D. S. Fu ◽  
K. Ishikawa ◽  
M. Minakata ◽  
K. Kodaira ◽  
H. Suzuki
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Dielectric And Piezoelectric Properties

Dielectric and piezoelectric properties of (110) oriented Pb(Zr 1− x Ti x )O 3 thin films

2016 ◽  
Vol 25 (5) ◽  
pp. 057701 ◽  
Author(s):  
Jian-Hua Qiu ◽  
Zhi-Hui Chen ◽  
Xiu-Qin Wang ◽  
Ning-Yi Yuan ◽  
Jian-Ning Ding
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Dielectric And Piezoelectric Properties

scholarly journals Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zrx, Ti1−x)O3 thin films as a function of composition

1999 ◽  
Vol 14 (11) ◽  
pp. 4307-4318 ◽  
Author(s):  
S. Hiboux ◽  
P. Muralt ◽  
T. Maeder
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Domain Wall ◽  
Diffraction Analysis ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited ◽  
Dielectric And Piezoelectric Properties

In situ reactively sputter deposited, 300-nm-thick Pb(Zrx, Ti1−x)O3 thin films were investigated as a function of composition, texture, and different electrodes (Pt,RuO2).X-ray diffraction analysis, ferroelectric, dielectric, and piezoelectric measurements were carried out. While for dielectric properties bulklike contributions from lattice as well as from domains are observed, domain wall contributions to piezoelectric properties are very much reduced in the morphotropic phase boundary (MPB) region. Permittivity and d33 do not peak at the same composition; the MPB region is broadened up and generally shifted to the tetragonal side.

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