Single shot spin readout using a cryogenic high-electron-mobility transistor amplifier at sub-Kelvin temperatures
Electromechanical Displacement Detection With an On-Chip High Electron Mobility Transistor Amplifier
2011 ◽
Vol 50
(6S)
◽
pp. 06GJ01
◽
Electromechanical Displacement Detection With an On-Chip High Electron Mobility Transistor Amplifier
2011 ◽
Vol 50
(6)
◽
pp. 06GJ01
◽
2017 ◽
Vol 187
(5-6)
◽
pp. 596-601
◽
2013 ◽
Vol 52
(4S)
◽
pp. 04CF03
◽
1998 ◽
Vol 31
(2)
◽
pp. 159-164
◽
2006 ◽
Vol 45
(No. 35)
◽
pp. L932-L934
◽